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FE-I4 Test Setup Hardware Needs: Boards & Interfaces

This project focuses on developing boards and interfaces for wafer probing and single chip testing compatible with FE-I4 requirements. The goal is to define connectors and adapter cards for both needs, addressing power, digital I/O, analog I/O, probes, and tests to ensure a comprehensive setup.

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FE-I4 Test Setup Hardware Needs: Boards & Interfaces

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  1. FE-I4 Test SetupHardware Needs: Boards & Interfaces March 1st 2010, Marlon Barbero

  2. FE-I4 Wafer Probing • FE-I4 wafer probing: FE-I4 compatible Connector FE-I4 wafer level tests extension board adapter card probe card

  3. Stand-alone FE-I4 test card • FE-I4 single chip test card: Connector Single FE-I4 test card FE-I4 extension board Note: might replace Spartan3 board by Virtex4 + 32Mb SRAM adapter card single chip card

  4. Goal today • Work towards definition of interface: • connector. • adapter card. … to fit both wafer probing test needs and single chip test card needs.

  5. Power • Extension Card inputs: • VDDA1. • VDDA2. • VDDD1. • VDDD2. • VDDD2 or indep? • VDDD1. • VEFUSE. • VDDD2. • FE-I4 power domains: • VDDA1 (1.4V). • VDDA2 (1.4V). • VDDD1 (1.2V). • VDDD2 (1.2V). • VDDDPLL. • VDDDT3. • VEFUSE (3.3V). • VDD_Efuse. indiv. analog power on/off indiv. digital power on/off

  6. Digital IO • LVDS in: • 40MHz_clock_in. • command_in. • AUX_clock_in. • LVDS out: • data out. • CMOS in: • Trig In. • RA1bar, RA2bar (tied together?). • RD1bar, RD2bar (tied together?). • Skipped • (3-lvds) module chip 1 in (-2 / -3). • (3-cmos) chip address.

  7. 2nd row & Analog IO • 2nd Row: • DisVbnA, DisVbnB, TdacVbp… (22 total) (some over-writtable?) • FE-I4 Analog Output: • Analog 1 test out (-2 / -3). • Ireference out. • Vreference out. • Analog Input: • Ireference in. • Vreference out (override). • in digiIO: LVDSinBias 1 (-2). • Injection: • analog injection IO: Chopper + DAC? (step or level?) • digital inject IO (?). • Skipped • sensor bias (???). • FE-I4 analog out: Options  pin headers / routed back / ADC. • FE-I4 analog in: Options  locally defined / DAC + jumpers.

  8. Probe & tests • Efuse: • Efuse_SR_clock. • Efuse_SR_out. • Efuse_Sel & Efuse_SR_RN. • capmeasure: • clock is the Efuse_clock. • analog out: capmeasure_current. • CMOS: • Bypass_ctrl. • Load_global_latches 1 (-2). • Global pulse. • InMUXselect & InMUX. • CMOSout.

  9. Summary power • summary • - regulator • - domain EN • connector • sensing ADC lvds FE-I4 cmos lvds LVDS selected Analog? analog IO cmos 3.3V ??? pin headers CMOS mux ADC I2C, SPI DAC adapter card Connector extension board, 2 flavors level shifter

  10. Interface / Connector Grand Total •  Analog for Single Chip Card: • go to pin header, no ADC. • input to FE-I4 locally defined. • few selected analog go to interface card ADC? • Chopper + DAC. • Note: High Voltage section on extension card. •  Analog for Wafer Probing: • ADC & DAC? • Not all analog test signal probed? • Which overwrites are necessary? • power: 5 • lvds in: 3 • lvds out: 1 • cmos in: 17 • cmos out: 4 (no pix_SR_out?) • I2C, SPI: 2-4

  11. Analog Summary Analog: • output: 27  22 “2nd row”, 3 analog test out, 1 Ireference out, 1 Icapmeasure. • input: 3  2 LVDSinBias (for 2 groups), 1 Ireference in. • input/output: 2  Vreference out & overwrite.  Injection pulse in / out. Other: • External NTC for reference needed on extension card?

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