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CB Operating Principles By G. Eswar Rao, AE, Khammam. Primary Functions of Circuit Breakers. Carry Rated Current at rated Voltage and rated Frequency Interrupt rated current at rated Voltage and Frequency
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CB Operating Principles By G. Eswar Rao, AE, Khammam
Primary Functions of Circuit Breakers • Carry Rated Current at rated Voltage and rated Frequency • Interrupt rated current at rated Voltage and Frequency • Interrupt fault currents depending on the fault level of that particular location. • Maintain rated dielectric (power and impulse voltages) in open condition.
Recovery Voltage and build up of dielectric strength of the medium Dielectric Strength TRV
Dielectric Strength of Medium • Depends on: • Contact speed • Gap distance • Arcing electrode shape- arcing wear will play a larger role in determining the behaviour of the CB • Field distribution within the contact gap
Operation of BHEL make CB Stage1: Both PIR and Main Contact are Open Stage 2: PIR is closed whereas Main Contact is Open Stage 3: Main Contact Closes Stage 4: PIR Opens out Stage 5: Both Main and PIR in Open Condition
Operating Mechanisms • Hydraulic • Pneumatic • Spring • Pneumatic Spring • Hydraulic Spring
SF6 Circuit-Breakers - evolution since 1974 Evolution of Tripping Energy
CB Parameters • Operating Timings • Trip • Close • Pole Discrepancy • Electrical Timings • Mechanical Timings
CB Duty Cycles • O-0.3sec-CO-3min-CO • CO-15sec-CO • Close Time- max-150ms and 200 ms for 400kV and 220kV respectively • Trip Time – 2 Cycle CBs, Mechanical and Electrical Time
CONDITION ASSESSMENT TECHNIQUES • ON LINE CONDITION ASSESSMENT TECHNIQUES • OFF LINE CONDITION ASSESSMENT TECHNIQUES
ON LINE CONDITION MONITORING TECHNIQUES • SF6 GAS PRESSURE MONITORING • TRIP COIL SUPERVISON • AUXILIARY CONTACTS OPERATING TIMINGS • CONTACT SPEED MEASUREMENT BY INSTALLING TRANSDUCERS
OFF LINE CONDITION ASSESSMENT TECHNIQUES • OPERATING TIMINGS OF MAIN AND AUXILIARY CONTACTS-1 Y • DEW POINT MEASUREMENT OF SF6 GAS-4Y • DYNAMIC CONTACT RESISTANCE MEASUREMENT-2Y • TAN DELTA MEASUREMENT OF GRADING CAPACITORS- 4Y • TRIP/CLOSE COIL CURRENTS MEASUREMENT-1Y • STATIC CONTACT RESISTANCE MEASUREMENT-2Y
Factors affecting Testing • Reliable operation of Testing Instrument • Pollution • Moisture/ Relative Humidity • Temperature • Electromagnetic Field • Human Error
SOURCES OF MOISTURE IN CB • GAS HANDLING – FILLING AND EMPTYING THE CB. AIR MAY BE LEFT DURING EVACUATION WHICH SHALL ADD TO IMPURITIES IN SF6 GAS. EVACUATION TO BE DONE UPTO 1 mbar (CIGRE-WG23) • EXUDATION OF MOISTURE CONTAINED IN ORGANIC INSULATING MATERIALS. • PERMEATION THROUGH SEALED SECTIONS
DEW POINT MEASUREMENT • IF SF6 GAS CONTAINS MOISTURE, IT IS EASILY HYDRATED TO PRODUCE HIGHLY REACTIVE H2SO3 AND HF(HYDROGEN FLUORIDES). • AS THESE CHEMICALS CAUSE DEGRADATION OF INSULATION AND CORROSION IN THE INTERRUPTING CHAMBER, MONITORING OF MOISTURE CONTENT IN SF6 GAS IS VERY IMPORTANT.
DECOMPOSITION OF SF6 GAS ARCS DURING TRIPPING OPERATION LEADS TO A SUBSTANTIAL EROSION OF THE CONTACT AND INSULATION MATERIALS BY THE HOT ARC. THE MAIN CAUSE FOR SF6 GAS DECOMPOSITION IS THE REACTION OF THESE EROSION PRODUCTS WITH FRAGMENTS OF THERMALLY DISSOCIATED SF6 AND OTHER TRACE GASSES SUCH AS OXYGEN AND WATER VAPOUR. (A) Cu + SF6 = CuF2 + SF4 – COPPER POWDER (B) W + 3SF6 = WF6 + 3 SF4 - TUNGSTEN (C) CF2 + SF6 = CF4 + SF4 - ERODED PTFE ( A CF2 POLYMER)
EFFECTS OF CONTAMINATION • DECOMPOSITION PRODUCTS ARE CORROSIVE AND MAY AFFECT THE SURFACE INSULATION BY THE FORMATION OF CONDUCTIVE LAYERS ALONG THE INSULATORS. • HUMIDITY/MOISTURE IS VERY DANGEROUS WHEN IT CONDENSES ON THEM IN LIQUID FORM CAUSING REDUCED INSULATION STRENGTH • CUF2, WO3, WO2F2 ORIGINATE FROM CONTACT EROSION. • HEALTH RISK DUE TO BYTOXIC PRODUCTS LIKE SO2 ETC.
NEED FOR DCRM • During normal contact resistance measurement, healthiness of main contacts is evaluated Req = R*r/(R+r)= r/(1+r/R), r = Main contact R = Arcing contacts • DCRM signatures/finger prints indicate true condition of CB arcing contacts. • Arcing contact play vital role during CB operation
DYNAMIC CONTACT RESISTANCE MEASUREMENT (DCRM) • CONTACT RESISTANCE MEASUREMENT DURING CLOSING AND TRIPPING OPERATION. C-O DELAY TIME ABOUT 300MS. • 100 AMP CURRENT IS INJECTED THROUGH CB CONTACTS. • VOLTAGE DROP AND CURRENT IS MEASURED TO COMPUTE CONTACT RESISTANCE. • VARIATION IN FINGER PRINT OF DCRM INDICATE PROBLEM IN ARCING AND MAIN CONTACTS.
Incoming Flange Outgoing Flange Main Contact, Moving Main Contact, Fixed Fixed contact Holder Arcing Contact, Moving Arcing contact, Fixed Moving contact Holder A Look at Contact Assembly…