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Stand-alone full chip, gate-level static timing analyzer. It analyzes the timing of large, synchronous, digital ASICs. Pre-layout static timing analysis. Synopsis Primetime. Setup and hold checks Recovery and removal checks Clock pulse width checks Clock gating checks.
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Stand-alone full chip, gate-level static timing analyzer. It analyzes the timing of large, synchronous, digital ASICs. Pre-layout static timing analysis Synopsis Primetime
Setup and hold checks Recovery and removal checks Clock pulse width checks Clock gating checks Static Timing Analysis
Unclocked registers Unconstrained timing endpoints Master-slave clock separation Multiple clocked registers Level-sensitive clocking Combinational feedback loops Design rule checks (maximum capacitance, maximum transition time, and maximum fanout) Design Analysis
Design file Synopsys database files (.db) Verilog netlist files Electronic Data Interchange Format (EDIF) netlist files VHDL netlist files Set up the operating conditions, wireload models, port load, drive, and transition time. Define the clock period, waveform, uncertainty, and latency. Specify the input and output port delays. Set multicycle paths. Set false paths. Specify minimum and maximum delays, path segmentation, and disabled arcs. Inputs -> Outputs • % flip-flops with violations • setup and hold violations • timing paths • rising edge input timing and falling edge input timing of all paths in the design • critical path for each clock group • timing report for each clock group • electrical design rule violations
Tight integration with other Synopsis tools Standalone (lower memory usage than Design Compiler, better performance) Primetime SI – cross talk aware analysis Benefits
Dataquest (2004): Synopsis holds 93% of STA market share ViewLogic Motive Bought by Synopsis Spice More for validation Cadence Pearl Mentor Graphics SST Velocity Alternatives
PrimeTime Tutorial: 1. Introduction to PrimeTime and the Tutorial Primetime Tutorial Have I Really Met Timing? - Validating PrimeTime Timing Reports with Spice Tobias Thiel Proceedings of the Design, Automation and Test in Europe Conference and Exhibition Designers’ Forum (DATE’04) Further Information