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足付き GEM ／ GEM 付き micromegas

足付き GEM ／ GEM 付き micromegas. 佐賀大学　大学院工学系研究科物理学専攻　１年 青座　篤史. Good point of GEM. Good point of micromegas. Gain is large. Easy to handle. Danger of damaging RO electronics is a little. Diffusion at the gas amplification is small. Weak point of GEM. Weak point of micromegas.

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足付き GEM ／ GEM 付き micromegas

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  1. 足付きGEM／GEM付きmicromegas 佐賀大学　大学院工学系研究科物理学専攻　１年 青座　篤史

  2. Goodpoint of GEM Good point of micromegas • Gain is large • Easy to handle • Danger of damaging • RO electronics is a little. • Diffusion at the gas amplification is small Weak point of GEM Weak point of micromegas • Gain is small • discharge Multi-layer structure Damage to RO electronics. • Diffusion at the gas amplification is large • The frame is necessary The frame becomes a dead space.

  3. GEM+micromegas（足付きGEM） GEM+micromegas • Structure to combine GEM with micromegas gas amplification area The amplification area is kept away from the reading part. amplification area • Gain is large • The danger of the electrical discharge is reduced. • The frame is unnecessary.

  4. Micromegas Pad micromegas 50μｍ • Operation test in air • There were a lot of electrical discharges in a low potential difference(250V～280V）.

  5. Result of electric field calculation by Maxwell3D • It is a high electric field in the place where the insulator is near Pad. • The insulator should be vertical to Pad.

  6. 200μｍ 50μｍ micromegas The same method as saclay group 15μm 足の形を円柱にしたメッシュのmicromegasをテスト setup Gas：P10：95％、C4H10：5％ Fe55　（5.9keV） Pad ED：100[V/cm] 天板 Pad • 3.01cmピッチ（Pad間隔100μｍ）

  7. Operation test of micromegas(mesh） P10：95％、C4H10：5％で440Vまで印加でき、動作する事は確認できた。

  8. 200μｍ 50μｍ GEM+micromegas（足付きGEM） 足付きGEM（サイエナジー社製）試作品 10ｃｍ×10ｃｍ 足の大きさ

  9. 6mm Pad 55Fe 0.1mm 1.17mm ３[ｃｍ] Operation test Setup Gas：P-10（Ar90%、CH410%） Ed：100[V/cm] ΔVGEM＝250[V] Pad~GEM：250[V]

  10. １ ２ ３ ４ Operation test It measures it by using six Pad.

  11. 55Fe ３[ｃｍ] 1.5cm 1.5cm 1mm Operation test Setup Pad Gas：P-10（Ar90%、CH410%） Ed：100[V/cm] ΔVGEM＝ 320[V] Pad~GEM：190～240[V]

  12. 55Fe Pad～GEM：210V Pad～GEM：190V Pad～GEM：200V Pad～GEM：220V Pad～GEM：240V Pad～GEM：230V

  13. The mixture ratio of the gas was changed. Ar：CH4=90：10 Ar：CH4=95：5 Ar：CH4=50：50 Ar：CH4=80：20 Ar：CH4=70：30 Ar：CH4=60：40 Ar：CH4=40：60 Ar：CH4=30：70 Ar：CH4=20：80 Ar：CH4=0：100

  14. Ed：100[V/cm] ΔVGEM＝320[V] Pad~GEM：210[V] Gas：P-10（Ar90%、CH410%） もう1枚の足付きGEM これまでの測定で使っていた足付きGEM resolution：0.13 resolution：0.10 • Result of measurement • 動作することは確認できたが、再現性がない。

  15. Summary • Gain is large was able to be confirmed. • no reproducibility. 詳しくはまだ解っていないが、足付きGEMはmicromegasに比べて構造が厚いため 足付きGEMをフラットにするには静電力が十分ではないようで、空気中で印加した 様子では、読み出しPadに張り付いてフラットになっているようには見えなかった。 今後、この問題を改善したい。

  16. electron ion GATE Question concerning Garfield IONFEEDBACK Feedback losses Avalanche GEMGATE 電子を通すときとは逆の電位差にして イオンをここで止める。 ion

  17. electron Ｑ1 GATE Ｑ2 Question concerning Garfield Q2/Q1ができるだけ1に近くなる セットアップ（ΔVGEM、hole、GAS） を調べる • Garfieldで電子をモンテカルロドリフト • 　させてQ2/Q1を評価する。

  18. collectionefficiency extractionefficiency step Question concerning Garfield • step size • Interval when position of electron is updated • Step size is specified by the number of collisions and length. • If the steps are too large, the method is inaccurate. • The calculations are stopped if the number of step • reaches the maximum number of steps allowed 1000 • It reaches the maximum number of steps before • the particle reaches the electrode if the step size • is too small.

  19. Question concerning Garfield • Number of collisions • length collection efficiency collection efficiency extraction efficiency extraction efficiency

  20. P-5 Ar‐CO２　70-30 GASEFFECT Measurement by Sauli simulation

  21. φ100μm φ70μm HOLEDIAMETEREFFECT Measurement by Sauli simulation

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