Efficient Storage of Defect Maps for Nanoscale Memory
Efficient Storage of Defect Maps for Nanoscale Memory. Susmit Biswas Tzvetan S. Metodi* Frederic T. Chong Ryan Kastner Tim Sherwood {susmit,chong,sherwood}@cs.ucsb.edu, kastner@ece.ucsb.edu, tsmetodiev@ucdavis.edu. *. Nanotechnology in Action. Scaling limit of CMOS Vdd ~ 1V Leakage
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