Enterprise Test Data Generation

Mar 29, 2023

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When testing new software functionality, it is important to have access to high-quality test data. This can be challenging due to large data volumes or different sources of data with varying permissions.

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Enterprise Test Data Generation

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Model-driven Test Generation

Model-driven Test Generation. Oleg Sokolsky September 22, 2004. Outline and scope. Classification of model-driven testing Conformance testing for communication protocols Coverage-based testing Coverage criteria Coverage-based test generation Can we do more? (open questions).

707 views • 51 slides

High-Level Test Generation

High-Level Test Generation. Test Generation by Enhancing Validation Test Sets*. * L. Lingappan, et al., VLSI Design, 2007 (Paper available on the class website). Basic Idea. Reuse validation test sequences Fixed control sequence, only data path values need to be determined

471 views • 30 slides

Automated Test Data Generation for Aspect-Oriented Programs

Automated Test Data Generation for Aspect-Oriented Programs. Mark Harman (King’s College London, UK) Fayezin Islam (T-Zero Processing Services, US) Tao Xie (North Carolina State University, US) Stefan Wappler (Berner & Mattner, Germany). Background.

544 views • 34 slides

Concurrent Test Generation

Vishwani D. Agrawal, vagrawal@eng.auburn.edu Alok S. Doshi, dosias@auburn.edu. Concurrent Test Generation. Auburn University, Department of Electrical and Computer Engineering Auburn, AL 36849, USA For more details, see http://www.eng.auburn.edu/~vagrawal. Problem Statement.

442 views • 19 slides

Test-Case Generation

Test-Case Generation. E. E1 “Feedback-Directed Unit Test Generation for C/C++ using Concolic Execution” Pranav Garg , Franjo Ivancic , Gogul Balakrishnan , Naoto Maeda, and Aarti Gupta E2 “A Learning-Based Method for Combining Testing Techniques”

554 views • 24 slides

Automatic Test Generation

Automatic Test Generation. Lecture 5 CS 6340. The Idea. Automatically generate tests for software Why? Find bugs more quickly Conserve resources No need to write tests If software changes, no need to maintain tests No need for testers?!. The Problem. Automated testing is hard to do

804 views • 43 slides

Automatic Test Generation

Automatic Test Generation. Generate a test sequence for a given behavioral description Some coverage metric is typically assumed Advantages of Automation: Less designer time/cost Less dependence on designer experience/ability Disadvantages of Automation:

297 views • 11 slides

Test Data Generation

SYST. TDAT. Test Data Generation. Approaches to Software Testing Sources of test Data Test Data from the Specification Test Data from the Design Test Data from the Programs Test Data from the Production Test Data from the Test Test Data Tables Test Data Files Test Data Assertions

1.08k views • 25 slides

Automatic Test Packet Generation

Automatic Test Packet Generation. Hongyi Zeng , Peyman Kazemian , Nick McKeown University , Stanford, CA, USA George Varghese UCSD , La Jolla Microsoft Research, Mountain View, CA, USA https://github.com/eastzone/atpg/wiki. Debugging the net.

897 views • 34 slides

Converged Networking for Next Generation Enterprise Data Centers

Enterprise Computing Community – ECC 2009. Converged Networking for Next Generation Enterprise Data Centers. Dr. Casimer DeCusatis Distinguished Engineer IBM Poughkeepsie, NY decusat@us.ibm.com. Enterprise Computing Community – ECC 2009. Trademarks.

330 views • 20 slides

Enterprise Generation Language

Doug Fulmer WW Sales Exec, e-bus Infrastructure iSeries. 2337 Hazy Meadows Ln Flower Mound, TX 75028 Tel 972-724-0288 (Bus) Tel 972-724-1202 (Home) Tel 214-507-0859 (Cell) dfulmer@us.ibm.com. Enterprise Generation Language. Better User Interface. Better Tools. Better

597 views • 43 slides

Automated Test Generation

Automated Test Generation. Recent advanced technique: Dynamic Symbolic Execution/ Concolic Testing Instrument code to explore feasible paths Example tool: Pex from Microsoft Research (for .NET programs).

388 views • 17 slides

Challenges for ERP Test Data Generation Test Data Characteristics and Constraints

Challenges for ERP Test Data Generation Test Data Characteristics and Constraints. Sebastian Wieczorek, SAP Research CEC Darmstadt 05.12.2007. Agenda. SAP Research Setup Introduction to eSOA 2.1. System 2.2. Data Categories Challenges 3.1. Test Data Constraints 3.2. Test Data Handling

425 views • 19 slides

Hierarchical Test Generation

R. 1. M. +. 1. M. R. 3. 2. *. M. 2. IN. &. &. &. &. 1. &. &. Hierarchical Test Generation. RT Level. Logic level. Transistor level. Defect mapping. x 1. x 4. System level. x 2. Defect. dy. x 3. x 5. Component level. W d. y*. Error. Logic level.

406 views • 32 slides

Automated Test Data Generation

Automated Test Data Generation. Maili Markvardt. Outline. Introduction Test data generation problem Black-box approach White-box approach. Introduction. Improtance of testing growing since mission-criticality of the software in our everyday life Software errors are more costly than ever

521 views • 32 slides

Concurrent Test Generation

Vishwani D. Agrawal Alok S. Doshi. Concurrent Test Generation. Auburn University, Department of Electrical and Computer Engineering Auburn, AL 36849, USA. Problem Statement. To find the smallest test set to detect all single stuck-at faults in a combinational circuit. An existing solution:

282 views • 17 slides

Automatic Test Data Generation of Character String

Automatic Test Data Generation of Character String. Zhao Ruilian. Outline. Introduction Automatic test data generation Character string predicate Automatic test data generation of character string A example Conclusion and Future work. Introduction.

560 views • 40 slides

Clique’s Generation Enterprise

Clique’s Generation Enterprise. REPRESENTS. PRODUCT NAME. ClickRite. PRODUCT DESCRIPTION. Multifunctional Device. Which helps in;. Writing. AND. Taking notes. At anytime and anywhere you WANT!. Combination of 4 important stationaries. PEN. PENCIL. ERASER. PAPERS. HOW IT WORKS?.

1.09k views • 96 slides

Test generation

Test generation. Gate-level methods Functional testing: universal test sets Structural test generation Path activation conception Algorithms: D, Podem, Fan Test generation for multiple faults Test generation for sequential circuits Random test generation

513 views • 49 slides

Automatic Test Generation

160 views • 11 slides

Test Data Generation for LRU Cache-Memory Testing

Test Data Generation for LRU Cache-Memory Testing. Evgeny Kornikhin Moscow State University Institute for System Programming of RAS. testing by test programs. add r1,r2,r3 sub r4, r1, r2 lw r5, r1, 0 lui r2, r1, r4. Y/N. assembly program ( test program ). microprocessor.

282 views • 24 slides

Test Data Generation

300 views • 25 slides

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