CLSI Beamline 06ID-1, Hard X-ray MicroAnalysis (HXMA)

1. CLSI Beamline 06ID-1, Hard X-ray MicroAnalysis (HXMA) N. Chen1, C.-Y. Kim1, G. Wright1, R. Igarashi1, J. Warner1, and D.T. Jiang21. Canadian Light Source, 2. Department of Physics, University of Guelph XAFS Endstation HXMA BL: The Hard X-ray Micro-Analysis (HXMA) beamline is a wiggler-sourced hard X-ray (5 – 40 keV) spectroscopy beamline. User Communities: XAFS, microprobe, and diffraction. Current Status: XAFS: successfully performing general users' experiments since Jan. 2007; Microprobe: opening for letter of intent; Diffraction: under commissioning Kohzu CMJ-1 fixed exit DCM : selectable Si(111) or Si(220) crystal pairs exchanged by transverse motion of the vacuum housing, indirect liquid nitrogen cooling for the monochromator 1st crystal ( max 500 W absorbing thermal power) and the 2nd crystal. The resolvability of the 1s-4d transition feature on the Cu K edge as a function of primary slit vertical opening, measured from a 7.5 m thick copper foil. The result was used as a guideline to setup collimating mirror bending radius. Exemplary spectra of standard foil samples acquired in transmission modes. The inserts in the upper and lower panel show the background removed XAFS data in k-space. The measurements were taken using Si(220) mono crystal and Pt coating stripes on the collimating and toroidal focus mirrors. 63 pole 2T superconducting wiggler Microprobe Endstation Hi-pressure powder diffraction setup at HXMA BL. Diffraction: Huber psi-8 diffractometer The HXMA diffraction capability is under commissioning. Initial powder diffraction commissioning activity has yielded encouraging results. Current diffraction commissioning emphasis is in the detailed understanding of the focused monochromatic beam characteristics for refining powder diffraction data and in the development of the instrumentation associated with the Huber psi-8 diffractometer for surface studies. White beam slits: 2.5 mm (V) x 4.0 mm (H) ~1/3 of the 1.5 mrad horizontal wiggler radiation fan. Phase transfer from ambient pressure phase (Left: 0.1 GPa), through phrase mixture (middle, 17.5 GPa), to new high pressure phase (right, 22.9 GPa) (John, et al., 2007) Knife-edge test shows that horizontal beam position changes less than 0.1 mm while the incident X-ray energy changes by 5.0 keV. Apparent change in edge shape is largely due to normalization process.