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Electrical Calibration of Timepix Test Stand Using Test Pulses Summary. Zhou Xing & Marina Artuso Syracuse University. Outline. Studies performed Test Pulse Generation using Pixelman DAQ Effective Threshold vs. Test Pulse(S-curve method) Ikrum sensitivity Pixel to pixel variation
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Electrical Calibration of Timepix Test Stand Using Test Pulses Summary Zhou Xing & Marina Artuso Syracuse University Zhou Xing VELO Upgrade discussion meeting
Outline • Studies performed • Test Pulse Generation using Pixelman DAQ • Effective Threshold vs. Test Pulse(S-curve method) • Ikrum sensitivity • Pixel to pixel variation • TOT Calibration Zhou Xing VELO Upgrade discussion meeting
2 levels input to MUX2: High = 1.35 v low ∝ DACs TP Amplitude=High-Low Rising time of “step” ~16 ns Check on DAC linearity (TP height) Perfectly linear Zhou Xing VELO Upgrade discussion meeting
Shutter Synchronization with Test Pulse Shutter Low Active • In “frame” acq. mode, the shutter width can be set by “acquisition time”(10 ms default) and the period of shutter is ~ 800 ms • In “test pulse” acq. mode, the shutter width is determined by: Shutter width=2 * (Period of TP) *( # of TPs) 100 pulses~52ms width (2*0.256*100) Period of Shutter ~ 750-800 ms 100 pulses~26ms width (2*0.128*100) Zhou Xing VELO Upgrade discussion meeting
Effective Threshold vs. Test Pulse Height Using S-curve method to indentify Effective Threshold test pulse is consistent between different pixels. Thesis Plot Pixel-to-pixel Gain Variation Zhou Xing VELO Upgrade discussion meeting
TOT Calibration THL=470 ( ~ 0.2 V) Ikrum=5 (default shaper settings) Counting Clk=40 MHz Testbeam Results THL=200 MIP Distributions of these 3 points are shown in next slide THL=425 THL vs. TOT Zhou Xing VELO Upgrade discussion meeting
TOT Distributions(500 TP’s) 0.2 v 0.2 v 0.2 v 0.3 v 0.3 v 0.3 v 0.85v 0.85v 0.85v 0.85 v Zhou Xing VELO Upgrade discussion meeting