Nanonics MultiView 400™

1. MultiView 400™ Product Presentation Nanonics MultiView 400™

2. MultiView 400™ Product Presentation MultiView 400 ™ Complete System

3. Modes of Operation MultiView 400™ Product Presentation • SPM modes: • AFM contact • AFM Intermittent • contact mode • STM • Electrical Measurements • Far Field Methods: • Standard MicroscopeImaging • Fluorescence • Confocal

4. Easy Integration with Optical Microscopes MultiView 400™ Product Presentation Dual - Upright /Inverted Optical Microscope

5. MultiView 400 ™ fits any Optical Microscope MultiView 400™ Product Presentation Olympus Inverted Zeiss Dual Zeiss Upright Olympus Dual

6. Normal Force Feedback MultiView 400™ Product Presentation • Standard AFM and cantilevered glass probes • Easy to use - standard beam-bounce feedback • All standard AFM imaging modes available • Free optical axis above and below

7. Standard NSOM/SPM Technology MultiView 400™ Product Presentation Cylindrical Piezo Probe is not Optical, microRaman or Electron/Ion Beam Friendly neither from the top nor bottom

8. The MultiView 400 ™ Technology MultiView 400™ Product Presentation Flat Scanner Probe is Optical, microRaman or Electron/Ion Beam Friendly from the top and the bottom

9. Nanonics 3D-Flatscan™ MultiView 400™ Product Presentation • Only 7 mm thick • 70 mm X-Y-Z scan range • Central opening providing clear optical axis • Inertial motion positioning of sample (6 mm)

10. Nanonics 3D-Flatscan™ with Closed Loop Sensors MultiView 400™ Product Presentation Nanonics 3D-Flatscan ™ with X-Y closed loop sensors • Capacitive displacement sensors • Precise positioning and scanning • Additional Z-sensor available • Central opening providing clear optical axis • Inertial motion positioning of sample (6 mm)

11. Magnetic tip placement MultiView 400™ Product Presentation • Easy & repeatable magnetic tip mounting • Easy magnetic attachment of the mount to the scan head • Large selection of specialized tips • Non-magnet holders available