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A Scanning probe techniques. Spectroelectrochemistry (ch. 16/17). Scanning tunneling microscopy (STM) Atomic force microscopy (AFM) Scanning electrochemical microscopy (SECM) UV & visible spectroscopy Transmission experiments Specular reflectance & ellipsometry
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A Scanning probe techniques. Spectroelectrochemistry (ch. 16/17) Scanning tunneling microscopy (STM) Atomic force microscopy (AFM) Scanning electrochemical microscopy (SECM) UV & visible spectroscopy Transmission experiments Specular reflectance & ellipsometry Internal reflection spectroelectrochemistry Second harmonic spectroscopy Vibrational spectroscopy: IR spectroscopy, Raman spectroscopy Electron & ion spectroscopy XPS, AES, LEED, HREELS, mass spectroscopy Magnetic resonance methods: ESR, NMR Quartz crystal microbalance X-ray methods: XAS, XRD
Scanning probe techniques (ch. 16) Microscopy: optical → scanning electron orforce → STM, AFM in situ vs. ex situ techniques Scanning tunneling microsocpy (STM)
STM images of HOPG STM images of Pt(111) with I-adlattice in HClO4
Cantilever displacement vs. z-deflection for (left) attractive interaction and (right) repulsive interaction
Electrochemical AFM AFM of Cu underpotential deposition (UPD) on Au(111)
Imaging surface topography & reactivity Ta oxide formation on Ta
SECM applications Electrochemical Cu etching Ag line formation
Spectroelectrochemistry (Ch. 17) UV & visible spectroscopy 1. Transmission experiments
Potentiostat Power meter He-Ne laser (633nm) Detector Electrochemical cell or EC devices In-situ transmittance test
Elliptic polarization arising from a phase shift between parallel & perpendicular components
Ellipsometry Ellipsometer
Ellipsometric results for anodization of Al in tartaric acid
Growth of polyaniline film: experiemental (dotted) vs. fiited resluts (solid)
5. Second harmonic spectroscopy Second harmonic generation (SHG)