1 / 13

AIDA ASIC Davide Braga Steve Thomas ASIC Design Group 14 October 2010

AIDA ASIC Davide Braga Steve Thomas ASIC Design Group 14 October 2010. Input comparator:. Now that the original diodes have been replaced by diode-connected pass transistors (not as fast or low impedance) the active-link circuit must take most of the input current.

dexter-rios
Download Presentation

AIDA ASIC Davide Braga Steve Thomas ASIC Design Group 14 October 2010

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. AIDA ASIC Davide Braga Steve Thomas ASIC Design Group 14 October 2010

  2. Input comparator: Now that the original diodes have been replaced by diode-connected pass transistors (not as fast or low impedance) the active-link circuit must take most of the input current. To avoid the build up of a large input voltage now that the passive link is slower, the active link must respond faster Necessary to optimize the input comparator

  3. Input comparator speed New comparator: appreciably faster across all corners ~ -50% -80% Vin (d=100ns) -with input diode-connected transistors -without Vin (d=200ns) no significant difference between the two, the diode-connected transistors don’t conduce 6.7ns 13ns 5.5ns 3.3ns old comparator Vin (d=300ns) NB: speed function of input voltage. In this simulation Vin=Vthreshold ±100mV, trise=tfall=10ns

  4. High ref, Qin=900pC (~18GeV) (1): link charge (d=100ns-200ns-300ns) Q_input Q_input Q_input Q_HEC Q_HEC Q_HEC LEC charge LEC charge LEC charge

  5. High ref, Qin=900pC (~18GeV) (2): Q_input Q_input Q_input Q_HEC Q_HEC link charge (detail) (d=100ns-200ns-300ns) Q_HEC

  6. High ref, Qin=900pC (~18GeV) (3): new comp new comp new comp old comp old comp old comp The new comparator is generally faster and loses less charge for very fast inputs

  7. High ref, Qin=900pC (~18GeV) (4): old comp new comp d=100ns Significant improvement for slower signals too. (NB: old and new configurations in these presentation have the same link, the only difference is the input comparator) d=200ns d=300ns

  8. Low ref, Qin=900pC (~18GeV) (1): Q_HEC_old Q_HEC_old Q_HEC_old Q_HEC_new Q_HEC_new Q_HEC_new Q_input

  9. Low ref, Qin=900pC (~18GeV) (2): new Vin old new old new old

  10. Low ref, Qin=900pC (~18GeV) (3): new Vin old new old new old

  11. Low ref, Qin=900pC (~18GeV) (3): new old new old Current: fast (~ns) feature, total current comparable (NB: absolute value in this graph due to ancillary circuits in the schematic) new old

  12. Link leakage current: T= -10°C ÷ +50°C Vdd= 3.0V ÷ 3.6V Voffset_preAmps= ±1.2mV Sample of the current through the HEC/LEC link for high-low input references, different process corners. The concern was that a possible offset between the amplifiers’ references could cause significant current. The current is <30 pA in the worst case so it will be easily handled by the feedback compensation circuit low_ref (0.4V), comparator thresh=0.35V [pA] [fA] high_ref (1.6V), comparator thresh=1.65V

More Related