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A multichannel detector array with 768 pixels

Explore a cutting-edge detector array featuring 768 pixels with advanced readout circuitry for high-resolution imaging applications. Benefit from reduced noise levels, high count rates, and improved uniformity across the array.

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A multichannel detector array with 768 pixels

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  1. A multichannel detector array with 768 pixels D.P. Langstaff, T.ChaseInstitute of Mathematical and Physical Sciences, University of Wales, Aberystwyth, SY23 3BZ UK UWA Array Concept – Keith Birkinshaw Science Driver & XPS – Andy Evans, Steve Evans, Alex Vearey-Roberts RAL/CCLRC/SRS Control Electronics – Richard Farrow, Jon Headspith, Richard Stephenson, Steve Burges CLAM4 mounting – Dave Teehan SRS 4.1 – Vin Dhanak, George Miller EPSRC WDA/KEF D.P. Langstaff

  2. Technology Overview • Multianode readout for Microchannel Plate • Custom ASIC • Linear Array of Collection Anodes • Charge Sensitive Amp + Discriminator + 16-bit Counter • Readout Circuitry • Ceramic Substrate & MCP Holder • Floating Control Electronics (ex vacuum) • Interface with TCP/IP • MCP power supply D.P. Langstaff

  3. Principle of Operation D.P. Langstaff

  4. Advantages of in-vacuum electronics • Made possible by ASIC integration • Reduce stray & cross couple capacitances. • >10pF  <1pF • Low impedance I/O through vacuum envelope • Reduced I/O wire count • Mass produced electronics • Make Moore’s law work for you! • Pulse Counting  Highly Linear D.P. Langstaff

  5. Detector Chips Past and Present MCD192 – 5mm x 2mm (circa 1995) MCD768 – 19.2mm x 3mm (Aug 2004) MCD384 – 9.6mm x 2mm (May 2003) D.P. Langstaff

  6. MCD768 ASIC Specification • 768 collection anodes • Anode size: 25mm × 3mm • Total Active Area: 19.2mm × 3mm • 16-bit counter per anode • ≈330,000 transistors • Fabricated on Alcatel 0.5mm process via Europractice D.P. Langstaff

  7. Detector Noise Floor • Due to β decay from potassium in MCP glass • Simply measured - X-rays OFF • Accumulate of long period (121 hr) • Average of 160 counts pixel-1 • 3.7 × 10-4 Hz pixel-1 D.P. Langstaff

  8. Detector Noise Floor D.P. Langstaff

  9. Maximum Count Rate • Particularly important for high brightness sources • Measured core level spectrum • Extract single pixel from data • Equivalent to 25μm analyser exit slit • Measured in excess of 2×104 Hz Pixel-1 • Due to recharging limitation of MCP D.P. Langstaff

  10. Maximum Count Rate D.P. Langstaff

  11. Uniformity across array • ASIC tolerances + MCP variations Non-uniformity at detector • Also focal plane distortion in analyser • Illuminate array as uniformly as possible • Result depends on analyser pass energy • Curves shown for CAE10 & CAE200 • curve for CAE200 offset for clarity D.P. Langstaff

  12. Uniformity across array D.P. Langstaff

  13. Applications • ‘Virtual channeltron’ – select pixels & sum in software. Acts as channeltron with variable entrance slit. • ‘Weaving mode’ – Combine data from all pixels during sweep • ‘Snapshot’ – Image feature on array, monitor peak amplitude and position D.P. Langstaff

  14. Front grid shadow Snapshot Readout from MCD768 XPS of Diamond <111>, MgKa source, UWA D.P. Langstaff

  15. Monitoring deposition of SnPc on GaAs by real-time XPS • A.Evans, A.Vearey-Roberts, A.McGlynn [In Preparation] • Monitor Ga3d, As3d, Sn4d & Valence band edge during SnPc deposition • Reading cycle • Ga3d – 1s/As3d – 1s/Sn4d – 1s/Valence – 10 s • With settling time + overheads  ~20s/cycle • 764 cycles over 4 hour experiment D.P. Langstaff

  16. Monitoring deposition of SnPc on GaAs by real-time XPS Preliminary Data D.P. Langstaff

  17. Monitoring deposition of SnPc on GaAs by real-time XPS Preliminary Data D.P. Langstaff

  18. Conclusions • 768 channel MCP based detector • 25um channel pitch • 19.2mm in dispersive direction • Noise: ~ 4×10-4 Hz Pixel-1 • Max Count Rate: >2x104 Hz Pixel-1 D.P. Langstaff

  19. Further Work • Analyser focal plane • Comparative study • Longer array – reticle stitching • SRIF • 2D Detector D.P. Langstaff

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