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Pre-layout prediction of interconnect manufacturability. Phillip Christie University of Delaware USA. Jose Pineda de Gyvez Philips Research Laboratories The Netherlands. Front end of design. Front end of line. Synthesis. Silicon processes. Floor planning. Dielectric processes.
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Pre-layout prediction of interconnect manufacturability Phillip Christie University of Delaware USA Jose Pineda de Gyvez Philips Research Laboratories The Netherlands
Front end of design Front end of line Synthesis Silicon processes Floor planning Dielectric processes Placement Planarization Routing Metal processes Timing closure Yield Back end of design Back end of line BEOD and BEOL OptimizationThe BEBOP Project SLIP Tools (MATLAB WireTools) Technology file
Nets per cell (npc) Terminals per net (tpn) Netlist signature Netlist Floorplan Placement Routing Yield
Rent exponent Netlist Floorplan Placement Routing Yield
Wiring signature cube Netlist 1 Floorplan Placement 0.8 p Routing 0.6 6 4 6 5 4 Yield 2 3 2 tpn npc
Floorplan design Netlist Floorplan Placement Routing Yield
Site occupancy probability Netlist Floorplan Probability of occupancy Linear axes Placement Number of available sites Routing Yield
Model Development Wire length distribution Netlist Floorplan p=1.0 Placement 0.9 0.8 0.7 0.6 0.5 Routing Applications
Routing Model Netlist Floorplan Placement Routing Yield implemented with via blocking
Yield prediction Netlist Floorplan Placement Routing Yield
Netlist Floorplan Placement Routing Yield
wire length, l x=w wire width, w x=1.2w width of critical area = x-w x=1.5w defect size, x length of cut critical area = l Cut model Netlist Floorplan Placement Routing Yield
Bridge model Netlist wire overlap length, m Floorplan x=s Placement x=1.2s Routing x=1.5s Yield length of bridge critical area = m+x
Probability of Failure Netlist Floorplan Placement Routing = Defect size distribution X Sensitivity Probability of Failure Yield
1 0.8 0.6 Sensitivity 0.4 0.2 0 3 0 1 2 3 Defect size -6 x 10 Cut sensitivity prediction Netlist Floorplan Placement Routing Yield
Bridge sensitivity prediction Netlist 1 Floorplan 0.8 0.6 Placement Sensitivity 0.4 Routing 0.2 0 0 1 2 3 Defect size -6 x 10 Yield
Layer 1 2 3 4 5 6 Cuts POFn (predicted) 2.92% 2.92% 2.91% 2.90% 0.61% 0.34% POFn (extracted) 2.80% 2.53% 2.09% 2.30% 0.49% 0.36% Bridges POFn (predicted) 1.14% 1.14% 1.13% 1.13% 0.21% 0.21% POFn (extracted) 1.82% 1.53% 1.17% 1.13% 0.28% 0.16% Theory versus experiment Netlist Floorplan Placement Routing Yield
Conclusions • Wiretools is a program development environment for interconnect analysis • Wiretools enables technology and design exploration (BEBOP) • Cut model easy to implement if wire length distribution known • Bridge model can be modeled using basic probability theory • Yield modeling is critical for interconnect geometry optimization
Acknowledgements • William Rey, Leo Sevat, Martijn Bennebroek • Philips Research Laboratories • National Science Foundation (CCR-9872159)