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Optical Readout Interface (ORI). latency. +24 ns. +24 ns. +300 ns. Conf. Mem. 125MHz. 120MHz 8 bit DDR. I2C. SERDES 2.5GBits/s. Laser Driver. CPLD. LVDS-TTL. HCM (TRAP). 16. DDR SDR Resynchronization, status, counters. VCSEL. Laser Diode 850 nm.
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Optical Readout Interface (ORI) latency +24 ns +24 ns +300 ns Conf. Mem. 125MHz 120MHz 8 bit DDR I2C SERDES 2.5GBits/s Laser Driver CPLD LVDS-TTL HCM (TRAP) 16 DDR SDR Resynchronization, status, counters VCSEL Laser Diode 850 nm
ORI – production test (laser diode) Several parameters controlled: • Supply currents at various operation mode conditions • Voltages on the board in enabled/disabled state • Source, bias and modulation currents through the laser diode • Temperature of the laser driver chip • optical output power • photodiode current measured by the laser driver chip
No permanently damaged components. Equivalent time in years in blue, * - the device fails. Recovery after power cycle or switching off for up to 12 hours (VR and Laser Driver). The configuration of the CPLD and EEPROM was not damaged. Laser DriverLinear Technology LTC5100 100* VCSEL DiodeULM PhotonicsULM850-02-LC-TOSA 20 EEPROM24LC01 30* LVDS TransceiverNational SemiconductorDS90LV048A 30 SerializerTexas InstrumentsTLK2501 250* CPLDLatticeLC4256V 15-50* Voltage RegulatorsNational SemicondutorLP3962-3.3 and -2.5 60-110* F.Rettig
GREG GCNTc D Q E D Q comp C E A decoder C B Y0 Q Q A=B GCNTp Y1 D Q Y2 A E Y3 C C C VALID D Q D Q OUT DATA D Q E C 4:1 mux with gray encoding C IN DATA D Q CLK E STROBE C Falling edge data