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Leaf Tests (slow control)

Leaf Tests (slow control). Utilizes USB test fixture and Labview Slow control (serial VME) working properly Initially sensitive to clock phase shift Problems surfaced when accessing second FPGA in control chain Layout dependent Switched to alternate serializer Manchester vs. NRZ

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Leaf Tests (slow control)

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  1. Leaf Tests (slow control) • Utilizes USB test fixture and Labview • Slow control (serial VME) working properly • Initially sensitive to clock phase shift • Problems surfaced when accessing second FPGA in control chain • Layout dependent • Switched to alternate serializer • Manchester vs. NRZ • Results look good at this time

  2. Leaf Tests (MGTs) • All MGTs tested in loopback mode • All work as expected • Flaw in Leaf MGT power filtering discovered • Ferrites have too high DC resistance • Results in voltage drop of ~.2V • With both transmitter and receiver active • Operational effects • MGTs sometimes have high bit error rates • Fail at least once in a 512 word transfer • This effect can be cleared by resetting the MGT • Multiple resets are sometimes necessary • Similar flaw exists on the optical reciever • Inductor bypassed as a temporary fix

  3. Leaf Tests (Source/Leaf) • Data transfer successful • Single channel test • Multiple channels (4) tested • Unexpected results with (full-up) source card system • Comma (sync) patterns observed in data stream (instead of some data words) • Consistent across source cards and Leaf MGT channels • Simplified Source firmware successful • Hard coded firmware generated patterns successfully generated by Source and received by Leaf • Consistent across Leaf MGT channels • Testing is in progress (with simplified Source firmware) • New Leaf firmware for automatic CRC test in test • Will allow simultaneous bit error rate testing on all MGTs

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