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Microscopic inspection of CLIC RF structures

Microscopic inspection of CLIC RF structures. Gonzalo Arnau EN/MME. Resources. People Ana Teresa Fontenla, Associate engineer, full time Markus Aicheler, Fellow engineer, full time Gonzalo Arnau, Staff engineer, part time Equipment Optical microscopes SEM W filament Leo 430 + EDS

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Microscopic inspection of CLIC RF structures

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  1. Microscopic inspection of CLIC RF structures Gonzalo Arnau EN/MME

  2. Resources • People • Ana Teresa Fontenla, Associate engineer, full time • Markus Aicheler, Fellow engineer, full time • Gonzalo Arnau, Staff engineer, part time • Equipment • Optical microscopes • SEM W filament Leo 430 + EDS • FE-SEM Zeis Sigma + EDS +EBSD

  3. Standard SEM inspection of RF structures • Procedure: EDMS 887717

  4. Standard and not standard SEM inspections examples • Standard for structure production. • Quadrant structure as machined • Disc before and after brazing • Disc dumped (milling and turning) as machined • Post-mortem • Other • Dedicated programs • Bonding tests • Other R&D activities for RF structures • DC spark test

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