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Disruption Analysis of PP, VV, and Components. Summary: Plasma shape from square to close to circular Benchmark again Hatcher’s 2D model results EM and structural analysis for P1-P5 Slow VDE. Plasma shape has some but limited impact Agree well with Hatcher results if same conductivity used
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Disruption Analysis of PP, VV, and Components Summary: Plasma shape from square to close to circular Benchmark again Hatcher’s 2D model results EM and structural analysis for P1-P5 Slow VDE • Plasma shape has some but limited impact • Agree well with Hatcher results if same conductivity used • P1-P5 Slow VDE • Peak disruption loads • Linearized stress on primary plate • Membrane ~40 MPa • Membrane+bending ~60 MPa • Linearized stress on secondary plate should be smaller
Eddy Current Centered Disruption – 60 Degree Model Electrical conductivity - Zhai Electrical conductivity - Hatcher Skin depth is ~3 times thicker for 10 ms VDE Skin depth of conductivity - 8.207x105 (LPP used in Hatcher) at 1 ms disruption is 18 mm but 57 mm at 10 ms VDE
Radial Field from Cyclic Symmetric Model – P1-P5 Slow VDE Same conductivities of PPs used as in Hatcher Br from Hatcher during P1-P5 slow VDE at 10 ms Br from Zhai during P1-P5 slow VDE at 10 ms Very close agreement
Vertical Field from Cyclic Symmetric Model – P1-P5 Slow VDE Same conductivities of PPs used as in Hatcher Bz from Hatcher during P1-P5 slow VDE at 10 ms Bz from Zhai during P1-P5 slow VDE at 10 ms Very close agreement
Radial Field from Cyclic Symmetric Model – P1-P5 Slow VDE Same conductivities of PPs used as in Hatcher Conductivity – 85% copper Conductivity – 85% copper for plates with gaps using Hatcher conductivity Eddy current at end of disruption
Vertical Field from Cyclic Symmetric Model – P1-P5 Slow VDE Same conductivities of PPs used as in Hatcher Conductivity – 85% copper Conductivity – 85% copper for plates with gaps using Hatcher conductivity
1/2 “ Plate P1 to P5 Slow VDE – Net Current and EM Loads New Model Previous Model
Deflection of Lower Primary Plate at 10 ms under Peak Disruption Loads
Stresses on Lower Primary Plate at 10 ms (Peak Disruption Loads) Linearized Stresses: Membrane ~40 MPa Mem+Bend~60 MPa Sm for CuCrZr ~170 MPa