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Nanoscale Imaging and Interrogation with Scanning Probe Microscopy

Explore the world of nanoscale imagery and manipulation with scanning probe microscopy, including the operation, forces involved, and applications across various fields. Learn about imaging atoms, interrogating nanoscale objects, and visualizing tunnel junctions at the atomic level.

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Nanoscale Imaging and Interrogation with Scanning Probe Microscopy

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  1. EXPLORING THE NANOLANDSCAPEScanning Probe Microscopy

  2. IMAGE GALLERY

  3. The Nanoscale • Atomic diameter ~ 0.3 nm = 3 Å • Microelectronics interconnect ~ 0.25 µm • http://www.intel.com/technology//itj/q31998/articles/art_1.htm • Red blood cell (5µm)

  4. Proximal Probes

  5. History • Topografiner • Tunneling through a controllable vacuum gap • Scanning Tunneling Microscope • Atomic Force Microscope (Scanning Force Microscope)

  6. Operation of a Scanning Probe Microscope • Scanning with sub-Angstrom precision • Probe detection (e.g., current, force, position, …) • Electronicsprocessing • Computer control • Image processing • Vibration isolation • Environmental control (e.g., vacuum, atmosphere, fluid; temperature)

  7. Scanning Tunneling Microscope Omicron

  8. Scanning Force Microscope

  9. Tunneling • One-dimensional tunneling • Density of electronic statesof sample and tip = sample wavefunction = tip wavefunction = workfunction

  10. Forces Typical: Contact vs. non-contact modes ... Forces to atto-newton (10-18 N) range ...

  11. Themes • IMAGING • INTERROGATING • MANIPULATING atoms and nanoscale objects

  12. IMAGING ATOMS AND NANOSCALE OBJECTS

  13. Large-scale  Atomic-scale Gold Grating 30 µm  30 µmSTM Graphite 4.2 nm  4.2 nmSTM DiNardo

  14. Semiconductor Surfaces - Si(100) Tilted dimer SymmetricDimer Unreconstructed L) OccupiedR) Unoccupied Hamers, 1986

  15. Temperature-dependent Reconstructions • Low-temperature Si(100)-c(42) vs. (2  1) • Domain boundaries, p(2  2) regions Wolkow, 1992

  16. Homoepitaxial Growth - Si(100) Mo, 1988

  17. Fractional Images • Probing atomic orbitals • Frequency-modulatedAtomic Force Microscopy • Si tip / Si(111)-77 Si atom Giessibl, 2000

  18. Metal Surfaces Wahlström, 1998

  19. 0.4 ML Ag/Cu(110) c(102) model a, b) 230230 nm2 c) 5.45.4 nm2 d) 3.83.8 nm2 Sprunger, 1996

  20. Interfaces - Cross-sectional Imaging Ohmori, 1999

  21. Molecular Adsorption - CO/Pt(111) Pederson, 1996

  22. Faulted Layer Orientation Change Interstitial Defect Recovery Line Defect Vacancy Coatings - Colloidal Latex Particles Brennan, 2000

  23. Coatings - Latexes

  24. Carbon Nanotubes Odom, 1998

  25. Overlapping Nanotubes Avouris, 1999

  26. Nanotube Shapes and Forces Avouris, 1999

  27. Biological Macromolecules - Collagen Brennan, 2000

  28. Biological Macromolecules - Fibronectin Brennan, 1999

  29. INTERROGATING ATOMS AND NANOSCALE OBJECTS

  30. Visualizing the Tunnel JunctionSTM-TEM Naitoh, 1996

  31. Scanning Ohnishi, 1998

  32. Bias-dependent imaging ~ Graphite DiNardo

  33. Bias-dependent imaging ~ GaAs(110) • GaAs(110) (cleaved) surface Feenstra, 1987

  34. Spectroscopy ~ on the Nanoscale • Beam techniques average over surface species • SPM techniques measure density of states related to the atom (or molecule) under the tip • electronic spectrum - measure dI/dV [or (dI/dV)/(I/V)] Hamers, 1986

  35. Electronic SpectroscopyAtom by Atom • Reconstructed Si(100)-21 surface • Dimers • Occupied electronic states of dimers (between atoms) • Unoccupied electronic states of dimers (away from atoms) Hamers, 1986

  36. Defects • Atomic-sized defects • Al/Si(111)-√3√3 structure • different electronic states Hamers, 1988

  37. Chemical Reactivity NH3 reacted with the Si(111)-77 surface Wolkow, 1988

  38. Vibrational SpectroscopyMolecule by Molecule Lauhon, 2000

  39. Chemical Reactions Electron-induced dissociation product -pyridine on Cu(100) at 8K Lauhon, 2000

  40. Surface DiffusionChasing Atoms with the Atom Tracker Swartzentruber, 1996

  41. H-enhanced diffusion of Pt atoms an STM movie ... Horch, 1999

  42. Electrostatic Force Microscopy (EFM) • Application • Topography of integrated circuit • Monitoring an active integrated circuit Digital Instruments, www.di.com

  43. Scanning Capacitance Microscopy Nakakura, 1999

  44. Magnetic Force Microscopy (MFM) • Magnetic tip interaction with surface • Application: Disk drive • Morphology • Magnetic structure Digital Instruments, www.di.com

  45. Scanning Chemical Microscopy • Measure chemical interaction between the tip and sample • Functionalize the tip with hydrophobic or hydrophilic species • Scan over surface and measure adhesion force or friction force

  46. Carbon Nanotube Tips- Functionalization - Wong, 1998

  47. Scanning Chemical Microscopy Frisbee, 1994 / Wong, 1998

  48. Adhesion Forces Wong, 1998

  49. Friction Force Microscopy • Macroscopic friction forces • Microscopic friction forces

  50. Polymer Thin Films Polypropylene film (a) AFM + (b) FFM, (c) non-contact AFM Nie, 1999

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