1 / 38

Photoemission Fundamentals of Data Acquisition and Analysis J. A. Kelber, June 12 2007

Photoemission Fundamentals of Data Acquisition and Analysis J. A. Kelber, June 12 2007 Texts: PHI handbook, Briggs and Seah Outline: Photoemission process How an xray source works How electrons enter the analyzer What do we mean by Pass Energy? Atomic Sensitivity Factors.

mccrimmon
Download Presentation

Photoemission Fundamentals of Data Acquisition and Analysis J. A. Kelber, June 12 2007

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. Photoemission Fundamentals of Data Acquisition and Analysis • J. A. Kelber, June 12 2007 • Texts: PHI handbook, Briggs and Seah • Outline: • Photoemission process • How an xray source works • How electrons enter the analyzer • What do we mean by Pass Energy? • Atomic Sensitivity Factors

  2. Some slides adopted from…

  3. ACRONYMS

  4. Photoemission process Emission of photoelectron KE = hv-BE, where BE= binding energy of electron in that atom e- Photon E = hv Ionization of atom

  5. Since the kinetic energy of an electron is directly related to the binding energy in the solid: KE = hv –EB - Φanalyzer • We can use core level photoemission for: • Quantitative analysis of surface/near surface compositions • Bonding environment of a given atom (small changes in KE, the “chemical shift” • Electronic structure of the valence band

  6. 3 step model of photoemission: • Originally due to Spicer • (e.g., Lindau and Spicer, J. El. Spect. and Rel. Phen. 3 (1974) 409) • Step 1: Excitation of photoelectron (cross sections, rel. intensities) • Step. 2. Response of the system to the core hole (final state effects, like screening of the core hole, shakeup) • Step. 3. Transport of the photoelectron to the surface and into the vacuum . (Inelastic mean free path considerations).

  7. Caution: Note that rigorously, the energy of a photoelectron transition is the difference in energy between the initial (ground state of the system with n electrons, and the final state, with n-1 electrons around the atom (ion) and an electron in the vacuum (n-1 + 1): Etransition= Efinal(n-1 + 1) - Einitial (n) Therefore, the energy of the transition therefore reflects screening of the core hole in the final state. This is generally not a factor in most uses of XPS, but can be important in, e.g., determining the size of metal nanoparticles. (see publication for Pt/SrTiO3)

  8. X-ray Source Electrons emitted from one of two filaments (depending on source selected) Electrons at 15 KeV strike Al or Mg anode, causing emission of characteristic x-rays; Kα, Kβ, etc. + background User selects one or other anode for use Al +15 KeV Mg e- e- Emits characteristic lines, but also other lines that can broaden spectra e- e- hv = 1253.6 eV hv=1483.6eV Filaments (at ground)

  9. Photoemission Process Some electrons will reach the analyzer without undergoing inelastic interactions with solid: KE = hv-BE-Φanalyzer. These electrons (Auger or photemission) will occur as elastic, or characteristic peaks in the electron emission spectrum Others will interact with the solid and lose energy (and chemical information). This contributes to the secondary electron background Background Note: Background intensity “step” increase occurs at KE< KEpeak Why? Why does background increase towards lower KE? Elastic Peak N(E) KE

  10. Pass Energy = C(V0-VI) Outer Hemisphere (VO) Only electrons with E = Epass+/- δE get thru the analyzer δE increases with Epass Inner Hemisphere VI Note: Intensity Increases with Pass energy, resolution decreases! e- E = Epass Detector Retards Electrons to Epass Retarding/focussing lens KE-Vretard = Epass (Vretard varied, Epass constant) e- E = KE

  11. Sweeping the retarding voltage allows one to sweep out the electron distribution curve (photoemission spectrum)

  12. Detecting Photoelectrons: The Channeltron Horned-shape device Lined with low workfunction phosphor Electron in many electrons out (cascade) Gain ~ 107 e- 107 e- Vbias

  13. Photoemission from a core leve e- hv KE ~ hv –EB - Φanalyzer Evacuum Work function, sample surface(Φsurface) EFermi Valence Band EB 3p 3s 2p 2s 1s

  14. Auger: KE of (KL1L2) transition = EK-EL1-EL2 –U(final state) Is independent of excitation source energy However, when plotting BE (along with XPS data), the peak position depends on hv. More on Auger later on

  15. Sample/Spectrometer Energy Level Diagram- Conducting Sample Why Φanalyzer? e- Sample Spectrometer Free Electron Energy KE(1s) KE(1s) Vacuum Level, Ev spec sample hv Fermi Level, Ef BE(1s) E1s Because the Fermi levels of the sample and spectrometer are aligned, we only need to know the spectrometer work function, spec, to calculate BE(1s).

  16. Binding Energy: The binding energy is calculated: BE = hv-KE-φ where φ = detector work function (normally 3-5 eV) φ is typically used as “fudge factor’ to align a calibration peak with accepted literature values prior to the start of the experiment

  17. Why do we use constant pass energy? • Resolution Constant, with kinetic Energy • Easier to quantitatively compare peaks at different energies • Why do we retard electrons? • If we did not retard electrons: • ΔE = 0.1 eV would require resolution of 1 part in 104, very difficult • With retardation, ΔE = 0.1 eV requires resolution of 1 part in 100 (much easier!)

  18. Conclusion: Practical experience shows initial state effects dominate in XPS (with exceptions): ΔE(Binding) = kΔqi + Vi ground state characteristics. Thus, careful analysis of the XPS spectrum typically yields info regarding chemical bonding in the ground state.

  19. Exception: Nanoparticles

  20. Exception: Nanoparticles reflect final state screening Exception: Nanoparticles Oxidized Pt Binding energy decreases as Pt particle size increases Pt(111) 71.2 eV

  21. Shift in BE reflects enhanced final state screening with increased particle size. d Limited charge, small screening Larger screening response ΔR ~ d See Vamala, et al, and references therein ΔEB = ΔE(in.state) – ΔR + other effects (e.g., band bending) where ΔR = changes in the relaxation response of the system to the final state core hole (see M.K. Bahl, et al., Phys. Rev. B 21 (1980) 1344

  22. Pass Energy and Analyzer Resolution

  23. Quantitation: • Cross sections, transmission functions, and intensities • Attenuation

  24. Includes instrumental transmission function, lens factors, etc.

  25. Transmission Functions (T) T = T(KE) probability of an electron of KE going thru the analyzer to the detector Typically, T~KE-1/2 , but this can be analyzer dependent. Atomic sensitivity factors typically “adjusted by some manufactures—e.g., PHI has adjusted spot size (lens ) to change with KE. For other manufacturers, can use Scofield cross-sections

  26. Alloy AxBy To a first approximation: We have the concentration of A (NA) is given by IA = NA FA where F = atomic sensitivity factor Thus: NA/NB = (IA FB)/IBFA More accurately, this should be modified by the mean free path λA: NA/NB = IAFBλB/IBFAλA

  27. Summary: XPS typically done with laboratory-based Al or Mg anode sources Quantitative surface region analysis possible Hemispherical Analyzer, Retarding mode is the preferred laboratory tool Still to come: Chemical Shift Mean free path and attenuation, Auger and final state effects

More Related