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Summer '07 at CLS

Small Angle X-Ray Scattering. Summer '07 at CLS. Peter Chen. Chithra Karunakaran & Konstantine Kaznatcheev. to provide an alternative imaging technique to STXM : to understand structural information of sample. Purpose. (Feser/Jacobsen).

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Summer '07 at CLS

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  1. Small Angle X-Ray Scattering Summer '07 at CLS Peter Chen Chithra Karunakaran & Konstantine Kaznatcheev

  2. to provide an alternative imaging technique to STXM : to understand structural information of sample Purpose (Feser/Jacobsen) (Miao, Charalambous, Kirz, Sayre, Nature 400, 342 (1999))

  3. Reconstruction diffraction pattern hologram image SEM image of letters, fabricated by gold dots, (100 nm in diameter each); diffraction pattern (middle) and reconstructed image (Miao, Charalambous, Kirz, Sayre, Nature 400, 342 (1999)). Only intensity is obtained, phase information is lost.

  4. Purpose Mie polar diagrams • to image smaller samples • to test stability and integrity of the optics and the microscope small x=pa/l large

  5. Tasks: create software determine camera setup in the STXM experimentation take data with respect to different variables orientation geometry nature of samples Tasks Andor Vacuum supported CCD. 512 x 512 12.3 x 12.3 mm

  6. Software Visual Basic .NET 2003 Requirements basic: single imaging, video, exposure settings, etc. long exposure aXis readable data and header output beamline read and control Software

  7. Mechanics • Implementation • external placement

  8. SAXS camera OSA sample 1st order beam detector focus zone plate incident beam scattered wave

  9. Scans on the Mesh x x x Exposure: 100 secEnergy: 710 eV

  10. Change in Focus • Defocusing of beam by 10 um by 30 um

  11. Change in Energy Energy: 709 eV Energy: 705 eV Energy: 703 eV

  12. Change in Slit Size 50 um x 50 um slit size 20 um x 20 um slit size 100 um x 100 um slit size 10 um x 10 um slit size

  13. Consistency • Iron Particles Exposure: 100 secEnergy: 710 eV Background Corrected 10 nm particle.

  14. Camera Placement Issue

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