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(a). (2). (1). (b). 8 pulses. Depth (nm). 2 pulses. Width (nm). Fig. 1 Magtoto et al., STM-induced Void Formation. (c). (a). (d). (b). 1.2. 1.2. 1.0. 1.0. 0.8. 0.8. Depth (nm). Depth (nm). 0.6. 0.6. 0.4. 0.4. 0.2. 0.2. 0.0. 0.0. 0. 50. 100. 150. 200. 250. 300.

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  1. (a) (2) (1) (b) 8 pulses Depth (nm) 2 pulses Width (nm) Fig. 1 Magtoto et al., STM-induced Void Formation

  2. (c) (a) (d) (b) 1.2 1.2 1.0 1.0 0.8 0.8 Depth (nm) Depth (nm) 0.6 0.6 0.4 0.4 0.2 0.2 0.0 0.0 0 50 100 150 200 250 300 350 0 50 100 150 200 250 300 350 Width (nm) Width (nm) Fig. 2 Magtoto et al., STM-induced Void Formation

  3. (a) Cross Section (nm2) Electric Field (MV/cm) (b) Tunneling Current (nA) Fig. 3 Magtoto et al., STM-induced Void Formation

  4. (b) (a) Fig. 4 Magtoto et al., STM-induced Void Formation

  5. Initial State 1.3 Å Plane of Domain Rotation Ni Al Ni Al 3 3 Final State Fig.5 Magtoto et al., STM-induced Void Formation

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