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High-energy Performance of X-ray Imaging Spectrometers on board Astro-E. Kensuke Imanishi H. Awaki, T. G. Tsuru, K. Hamaguchi, H. Murakami, M. Nishiuchi, and K. Koyama Kyoto University, Japan. XIS (X-ray Imaging Spectrometer). X-ray CCD camera on board Astro-E
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High-energy Performance of X-ray Imaging Spectrometers on board Astro-E Kensuke Imanishi H. Awaki, T. G. Tsuru, K. Hamaguchi, H. Murakami, M. Nishiuchi, and K. Koyama Kyoto University, Japan
XIS (X-ray Imaging Spectrometer) • X-ray CCD camera on board Astro-E • Front illuminated, Frame transfer
Pulse Height distribution of XIS (55Fe) Mn Ka (5.89keV) 104 Mn Kb (6.49keV) Low energy tail Peak structure 103 102 Counts 101 100 10 -1 0 1000 2000 Channel
Divide the response function into 6 components Main peak Counts Sub peak Triangle component Si escape Si line Constant component Channel
Osaka University Kyoto University Si K edge 10 0 5 X-ray Energy [ keV ] Al Fe Ni Zn Se Cl Ti 55Fe Obtained data points Fluorescent X-ray Radio isotope
electron cloud X-ray Depletion Gate Insulator Main peak Main peak, Sub peak, Triangle component Sub peak Triangle component Channel Stop
Energy resolution (= Main peak width) 200 Energy resolution [eV] 100 Readout noise Wsi : mean ionization energy F : Fano factor Poisson statistics eV
1500 data calculation 1000 Assumption 1. Electron distribution is sphere with uniform density. 2. Electron cloud radius = 1.71X10-6E1.75 [cm] (Janesick et al. 1986) 3. Electrons generated in the insulator are not counted. Channel 500 Gate Constant component Insulator Depletion 0 103 104 102 101 100 10 -1 Counts
Relative Intensity of constant component Blue : data Green : calculation result Red : multiplied the calculation result by 1.59 10 -1 Constant intensity / Main peak intensity 10 -2 10 1 Energy [keV]
Si fluorescent X-ray (1.74keV) data simulation model Si line 10 Si escape 3 Energy [keV] 3 Total Si line 2 1 Si escape and Si line Si escape 2 1 10 -2 10 -3 Escape intensity/Main peak intensity
Si fluorescent X-ray (1.74keV) data simulation model Si line 10 Si escape 3 Energy [keV] Total Si line 2 3 2 Si escape 2 1 10 -2 10 -4 10 -3 Si line intensity/Main peak intensity
Reproducibility of the response function 55Fe (Mn) response function Ka:5.894keV Kb:6.489keV Mn L
Summary • The response function of XIS CCD camera was constructed. • We considered the physical process inside the CCD, and divided the response into 6 components. • Shape and Intensity of these components were determined as a function of X-ray energy.