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Coherent X-ray Imaging Instrument. S ébastien Boutet CXI Instrument Scientist June 9, 2009. Outline. Update since the last FAC KB mirrors New CXI layout Sample Chamber/KB mirror integration for the 0.1 micron focus. Coherent Diffractive Imaging of Biomolecules. One pulse, one measurement.
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Coherent X-ray Imaging Instrument Sébastien Boutet CXI Instrument Scientist June 9, 2009
Outline • Update since the last FAC • KB mirrors • New CXI layout • Sample Chamber/KB mirror integration for the 0.1 micron focus
Coherent Diffractive Imaging of Biomolecules One pulse, one measurement Particle injection LCLS pulse Wavefront sensor or second detector Noisy diffraction pattern Combine many measurements into 3D dataset Combined Data Set Reconstruction Data Frames
CXI Instrument Location Near Experimental Hall AMO X-ray Transport Tunnel SXR XPP CXI Endstation XCS Source to Sample distance : ~ 440 m Far Experimental Hall
Far Experimental Hall CXI Control Room Lab Area XCS Control Room Hutch #6 X-ray Correlation Spectroscopy Instrument Coherent X-ray Imaging Instrument
CXI Instrument Overview Detector Stage (upstream position) Particle injector LCLS Beam Sample Chamber Precision Instrument Stand Detector Stage (back position)
CXI KB Mirrors • CXI has two sets of KB mirrors to produce a 1 micron beam and a 0.1 micron beam • Discussed at last FAC • Coating • 45 degree geometry • Update • Apply single coating strip (SiC) • But leave space for at least another strip for later • The 45 degree geometry was abandoned • Benefits were not worth the risks
New CXI Layout • Discussed at last FAC • Put both sample chambers in series and have each KB system focus at different planes • Put KB1 system first and focus past the KB0.1 system • Place Be lenses between the 2 sample chambers to refocus the 100 nm beam into the second sample chamber • Keep ability to use the unfocused beam • Update • The new layout was implemented • The unfocused beam can be used in the 1 micron Sample Chamber
CXI with 1 micron and Unfocused Beam Diagnostics/ Common Optics Diagnostics & Wavefront Monitor 1 micron Sample Environment 1 micron KB Reference Laser
CXI with 0.1 micron Beam Diagnostics/ Common Optics Wavefront Monitor 0.1 micron KB & Sample Environment 1 micron KB Reference Laser
New Layout Advantages • Allows serial experiment configuration • Allows separation of mirror vacuum • Allows the use of a thin window to separate KB0.1 mirror vacuum from 0.1 micron sample chamber • Allows the second chamber to be removed without disturbing the mirrors • Allows a user chamber to be attached if needed
CXI 0.1 µm KB Mirrors/Sample Environment • Purpose • Produce a ~100 nm focus • Focal lengths • 0.9 m for M1 • 0.5 m for M2 • Requirements • Identical to 1 micron KB System in every way except for the mirror curvature • Integrated system with 0.1 micron Sample Chamber due to close proximity • Extend vacuum enclosure by ~600 mm for sample area • Separate both parts of the vacuum enclosure with valve and window
Custom Valves • 2 custom valves will be used • First one will hold vacuum in order to vent the Sample Chamber • Second valve will have a very thin x-ray transmissive window to separate UHV in KB tank from poor vacuum (~10-7 Torr) in Sample Chamber
Summary • The CXI KB mirrors will use a SiC coating strip • Space will be left available for another coating strip once some LCLS experiments have occurred • Use 2 sample chambers • One for each KB mirror pair • CXI abandoned the 45 degree KB mirror configuration • Maintain the ability to use the direct unfocused beam into the 1 micron Sample Chamber • The 0.1 micron KB/Sample Chamber System will utilize custom valves to allow venting of the Sample Chamber and a thin window to separate the vacuum of the mirrors from the sample