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電子顯微鏡 (SEM)

國立嘉義大學 應用物理學系、光電暨固態電子研究所. 電子顯微鏡 (SEM). 日本電子製　 JSM 5410 SEM 系 分解能 20 nm （ ZnO) 倍率 ×35〜50000 像の種類 二次電子像 反射電子凹凸像 反射電子組成像 電子光学系 加速電圧 5〜30 kV 電子銃 W ( 熱電子放射型電子銃 , 也可用 LaB 6 ). 電子顯微鏡 (SEM) 實體照片. 電子顯微鏡 (SEM) 規格資料. JEOL JSM-5410 :

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電子顯微鏡 (SEM)

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  1. 國立嘉義大學 應用物理學系、光電暨固態電子研究所 電子顯微鏡(SEM) 日本電子製　JSM5410 SEM系 分解能20 nm（ZnO) 倍率×35〜50000 像の種類二次電子像反射電子凹凸像 反射電子組成像 電子光学系 加速電圧5〜30 kV 電子銃W(熱電子放射型電子銃, 也可用LaB6)

  2. 電子顯微鏡(SEM)實體照片

  3. 電子顯微鏡(SEM)規格資料 JEOL JSM-5410 : The JSM-5410 scanning electron microscope is a high-performance multipurpose SEM with a high-resolution of 3.5 nm (at 30 kV, WD = 8 nm). Magnification Range: 15x to 200,000x (25 steps). C.f.  (without EDS now)  http://www.mtec.or.th/th/labs/sem/espect5410.html

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