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Scanning Electron Microscope Metrology for Forensics Applications

Explore the application of Scanning Electron Microscope (SEM) in forensics with a focus on calibration, precision, and interlaboratory studies. Learn from experts from the National Institute of Standards and Technology.

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Scanning Electron Microscope Metrology for Forensics Applications

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  1. Scanning Electron Microscope Metrology for Forensics Applications Michael T. Postek National Institute of Standards and Technology Gaithersburg, MD 20899 Short Course Presented at: SCANNING 2010

  2. SEM Metrology • Introduction • Calibration • Imprecision • Interlaboratory Study Sodium Chloride Courtesy of Frank Platek Suspect plant leaf Courtesy of Frank Platek

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