58 th ECTC, Lake Buena Vista, May 27–30, 2008
58 th ECTC, Lake Buena Vista, May 27–30, 2008. Drop Test Reliability of Lead-free Chip Scale Packages. Andrew Farris, Jianbiao Pan, Ph.D., Albert Liddicoat, Ph.D. California Polytechnic State University at San Luis Obispo Brian J. Toleno, Ph.D., Dan Maslyk Henkel Corporation
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