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A Behavioral and Temperature Measurements-Based Modeling of an Operational Amplifier Using VHDL-AMS. 17th IEEE International Conference on Electronics, Systems and Systems Athens-13th December 2010. Sahbi Baccar 12 , Timothée Lévi 1 , Dominique Dallet 1 ,
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A Behavioral and Temperature Measurements-Based Modeling of an Operational Amplifier Using VHDL-AMS 17th IEEE International Conference on Electronics, Systems and Systems Athens-13th December 2010 Sahbi Baccar12, Timothée Lévi1, Dominique Dallet1, Vladimir Shitikov2, François Barbara2 1 IMS Laboratory- Université Bordeaux 1, France 2 Schlumberger Riboud Product Center (SRPC), Clamart, France
Outlines Outline • Motivation and Context • Op-amp Description and Characterization • Development of HT Op-amp Models • Conclusion and Prospects
Outlines Motivation and Context • HTE (high temperature electronics), • a recent growing market with specific circuit requirements • Validity of SPICE industrial components models in HT? Reviewing transistor factors in HT ??
Outlines Motivation and Context • SPICE: among first simulator for ICs • Working conditions effect modeling in SPICE macro-model? • VHDL-AMS language: modern tool for AMS and multi-domain modeling and simulating huge time of computation: 23.5 hours for simulating a feedback of a PLL loop!! HTE Behavioral Modeling Emergence of: - new simulators - new modeling approaches 4
Outlines Outline • Motivation and Context • Op-amp Description and Characterization • Development of HT Op-amp Models • Conclusion and Prospects 5
Op-amp Description and Characterization • High Temperature Front End Amplifier Anaog Filter
Outlines Op-amp Description and Characterization Op-amp Stage 2 Stage 3 Stage 1 Vos , Ios, PSRR, CMRR, Rin,Cin, Zcm… Aol, GBPW, fol, SR-, SR+.. Voutlimp, Voutlimn, Rout… performance parameters 7
Outlines Outline • Motivation and Context • Op-amp Description and Characterization • Development of HT Op-amp Models • Conclusion and Prospects 8
Outlines Development of HT op-amp Models ParameterMeasurement(T1, T2,..) Fitting by MathematicalFunctions Error Evaluation HT Behavioral Model Development Simulation 9
Outlines Development of HT op-amp Models • Input Stage Model 10
Outlines Development of HT op-amp Models • Middle Stage Model sub-stage 1 sub-stage 2 11
Outlines Development of HT op-amp Models • Output Stage Model 12
Outlines Simulation Results and Discussions • Voltage Offset and Saturation Voltage Voutlimp (T1=25°C) Voutlimp (T2=150°C) Vos (T1=25°C) Slope1=Aol(T1=25°C) Vos (T2=150°C) Slope2=Aol(T2=150°C) Voutlimn (T1=25°C) Voutlimn (T2=150°C) 13 Test-bench circuit
Outlines Rf = 10 K Op Amp Developed Model Rs = 1 K Rl = 1 K Vin = 1 V Simulation Results and Discussions • Voltage Offset and Saturation Voltage 14 Test-bench circuit
Outlines Simulation Results and Discussions • Frequency Response and Open-Loop Gain Temperature Increases 15 Test-bench circuit
Outlines Parameter Extraction and Model Validation Title: Comparison of measured and simulated voltage offset for different temperatures 16
Outlines Outlines • Motivation and Context • Op-amp Description and Characterization • Development of HT Op-amp Models • Conclusion and Prospects 17
Outlines Conclusion and Prospects • A novelbehavioral op-amp model in HT • Simulation of major op-amp performance parameters • Modeling methodology based on measurement of performance parameters • Confirmation of VHDL-AMS abilities as a useful and modern modeling language • A first step to model the whole analog-front end of a data acquisition system: Op-amp, Filter and ADC 18
Outlines References [1] E. Bruls, M. Verstraelen, T. Zwemstra, and P. Meijer, “Analogue fault simulation in standard VHDL,” IEE Proc. Circuits, Devices and Systems, vol. 143, 1996, pp. 380. [2] F. Pecheux, C. Lallement and A. Vachoux, “VHDL-AMS and Verilog- AMS as alternative hardware description languages for efficient modeling of multidiscipline systems,” Computer-Aided Design of Integrated Circuits and Systems, IEEE Trans. on, vol. 24, n. 2005, pp. 204-225. [3] R. Kirschman, High-Temperature Electronics, Wiley-IEEE Press, 1998. [4] R. Johnson, J. Evans, P. Jacobsen, J. Thompson and M. Christopher, “The changing automotive environment: high-temperature electronics,” Electronics Packaging Manufacturing, IEEE Trans. on, vol. 27, 2004, pp. 164-176. [5] S. Baccar, S.M. Qaisar, D. Dallet, T. Levi, V. Shitikov and F. Barbara, “Analog to digital converters for high temperature applications: The modeling approach issue,” Instrumentation and Measurement Technology Conf. (I2MTC) IEEE, pp. 550-554, Austin, 3-6 May 2010 [6] G.B. Clayton et S. Winder, Operational Amplifiers, Fifth Edition, Newnes, 2003. [7] P.J. Ashenden, G.D. Peterson and D.A. Teegarden, The System Designer's Guide to VHDL-AMS: Analog, Mixed-Signal, and Mixed- Technology Modeling, Morgan Kaufmann, 2002. [8] H. Qin, F. Wang, “ Modeling of Operational Amplifier based on VHDLAMS”, in Proc. IEEE International Conference on Electronics Circuits and Systems 2006, pp. 894-897, Nice, 10-13 December 2010 19
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