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XP-746: ELM characterization in NSTX. R. J. Maqueda Nova Photonics Inc. and the NSTX Research Team. ’07 Results Review July 23-24, 2007 PPPL. XP-746: ELM characterization in NSTX. XP Goals.
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XP-746: ELM characterization in NSTX R. J. Maqueda Nova Photonics Inc. and the NSTX Research Team ’07 Results Review July 23-24, 2007 PPPL
XP-746: ELM characterization in NSTX XP Goals • Measure and characterize evolution of ELMs observed in NSTX: structure of ELM perturbed edge, birth of filamentary ELM structures, radial and poloidal/toroidal propagation in SOL, increase of edge turbulence and blobs, and recovery of inter-ELM profiles. • Obtain profiles for ELM stability evaluation. XP Summary • ½ run day on June 5th (17 shots: 124659-124675) • All 3 ELM Types produced and measuredType I: 124659-124664, 124669Type III: 124665-124668Type V: 124670-124675 • Good diagnostic availability:fast-framing cameras USXR arrays (JHU) static (ORNL/PPPL) and reciprocating (UCSD) probes reflectometers (UCLA) MIRNOV arrays (PPPL)
Fast-framing cameras show global and local evolution Fish-eye view no filter GPI view D2 puff - Da filter TYPE V ELMs Shot 124675 TYPE III ELMs Shot 124667 Lower divertor Da (a.u.) TYPE I ELMs Shot 124664 Time (s)
ELM filamentation after ELM onset GPI view no puff - Da filter ELM sequence • Mode growth. • Birth of ELM filaments. • Filament detachment (except in Type V ELMs). • Filament radial and poloidal/toroidal propagation in SOL – eventual interaction with plasma facing components. • Turbulent filamentation and blobs, L-mode like. • Recovery of H-mode edge. TYPE I ELM
ELM filamentation followed by L-mode like turbulence and blobs tELM + [200,300] ms tELM + [300,400] ms tELM + [400,500] ms tELM + [500,600] ms tELM + [600,700] ms Da emission (a.u.) dI/I Kurtossis Lpol (cm) TYPE III ELM Shot 124667 tELM ~ 275.02 ms Drsep (cm) Drsep (cm) Fluctuation levels, auto-correlation lengths and kurtossis similar to L-mode
Summary ...work in progress... XP-746 run time shots and diagnostic availabilty provide excellent opportunity to meet XP goals • Characterization of ELM mode structure, evolution into filaments, and propagation of filaments in SOL. • Characterization of ELM filaments and associated transport. • Characterization of post-ELM turbulence (blobs) and related transport. • Availability of profile data for stability analysis.