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Reminder of BI specifications for HIE. HIE-ISOLDE meeting for BE/BI D Voulot 28/3/2014. Beam specifications. Radioactive ion beams (RIB)/stable pilot beams 0.3 to 10 MeV/u (for A/q = 4.5) Low intensity RIB: Few pps to some epA
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Reminder of BI specifications for HIE HIE-ISOLDE meeting for BE/BI D Voulot 28/3/2014
Beam specifications • Radioactive ion beams (RIB)/stable pilot beams • 0.3 to 10 MeV/u (for A/q = 4.5) • Low intensity • RIB: Few pps to some epA • Stable beam: 20 epA (can get more for machine development and tests) • Beam pulse structure • Rep. rate 1 to 50 Hz (asynchronous with PSB) • Pulse length 100 us • Micro bunch 101.28 MHz (~10 ns)
Beam intensity measurements • 1-100 epA (we do not require current measurements for the RIB) • 1% absolute accuracy / 0.1% relative accuracy over 10 min. (these are guidelines) • FC aperture 30 mm
Transverse profile and position • Beam size 1-5 mm (1σRMS) • Accuracy on beam size measurement 10% • For 20 epA beam expect 0.5-1 mm slit width • Beam position • absolute accuracy σRMS = ±0.2-0.3 mm • Relative precision of ±0.1 mm
Beam longitudinal profile measurement Passivated Implanted Planar Silicon (PIPS) detector (Canberra) for charged particle spectroscopy • energy spread resolutions of <1% (2σ) • bunch length resolutions <100 ps • beam energy spread between 0.1 and a few % (2σ)
Collimator and stripping foils • Set of circular apertures • Vertical slits before and after the benders (spectroscopy) • Stripping foils holders in front of benders (beam purification) • Combinations: • FC and scanning slit • FC and collimator (not mandatory) • FC and foils (not mandatory)
REX FESA classes • 2 FESA classes • + expert application
HIE Console applications + separate application for ToF and Si det. spectroscopy
Architecture of HIE control system • FESA classes • How many? • What properties/fields? • Expert application? • When can it be defined? available? • When can we start software test and debugging?