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Senior Design P13472 Final Presentation – Change of Resistance Test Stand. Colin Payne-Rogers Jacob Lennox Dr. Benjamin Varela (guide) Cooper Crouse-Hinds (sponsor). Project Description.
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Senior Design P13472 Final Presentation – Change of Resistance Test Stand Colin Payne-Rogers Jacob Lennox Dr. Benjamin Varela (guide) Cooper Crouse-Hinds (sponsor)
Project Description Prototype Change of Resistance Test Stand: measure multiple coil temperatures via 4-wire resistance measurements and a linear regression Test Control: via Labview interfaced with a PXI system including two 16-channel switches and one digital multimeter Deliverables: one relay box for metering and power control, configured NI PXI system for control and Dell Laptop as a user interface
Customer Needs, System • Design Interface Relay Circuit • Operate in the 120-600 VAC range • Connect using 2-Pin Amphenol cable • Select, Purchase Multimeter • Resolution of 0.01Ohm • Able to be calibrated • Select, Purchase Data Acquisition System • Incorporate a thermocouple • The design must comply with UL844 • The multimeter is of the correct resolution and the linear regression and formula advised by the standard are the same • System contained in a rolling enclosure
Customer Needs, Labview • Communicate with the measurement hardware • Measure up to 6 coils in any combination • First stabilized measurement within 5s ~ • Readings taken one at a time, 40 in 30s • Plot resistance versus time for each coil • Make a linear regression of the data and calculate the steady state coil • Store the data in 9 portable files ~ • Operator can input time, date, material • Time and date taken from Labview • Functions: pre-run test, auto-test, view results, print results and terminate
Design Summary • Power Control Circuit • 12 user inputs • Connection to Labview switch • Measurement Control Circuit (inputs) • 12 user inputs • Labview connection not shown • “Splitting” Terminal Block • Split for measurement • Two NI Switches • Channel connections shown • “Multimeter” Terminal Block • Multimeter – connections shown (hi, low, etc.)
Power Control Circuit Inputs 13-24 arefrom the ballast. 25 and 26 are120VAC inputs. NI Switch Connections
Measurement Control, Splitting Inputs 1-12 arefrom ballast. To NI Switches Connection topower and NIswitchingshown in thePower ControlCircuit
Splitting, NI Switches From 4PSTrelays Tomultimeterterminals
System Testing Results • All relay box connections active • 6 “coils” (known resistors) were connected to the relay box and measured with the multimeter 4-wire measurement to ensure all connections were working properly and no internal resistance was found • Labview code troubleshooting • “NaN” value removal, timing adjustments, etc. • Complete ballast test at steady state using Labview to run the test and to obtain the results (see next slide)
Successes, Incomplete, Future Work • Success • Purchasing multimeter, laptop, data acquisition software • Creating Labview code • Running a successful test at 120VAC • Incomplete • Rolling enclosure, Amphenol cable • Future Work • Contain the test in a rolling enclosure • Run a test at 600 VAC • After double-checking code and switches to make sure Labview components will never see the volts • Convert small gaged wire connecting PXI to relay box into an Amphenol cable • Staging the ballast power with a secondary set of relays