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Reliability and Safety Analysis. Team 3 ATV Daniel Barrett Sebastian Hening Sandunmalee Abeyratne Anthony Myers. High Criticality A failure that has the potential to injure the user or others Medium Criticality A failure that can permanently damage components of the device
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Reliability and Safety Analysis Team 3 ATV Daniel Barrett Sebastian Hening Sandunmalee Abeyratne Anthony Myers
High Criticality • A failure that has the potential to injure the user or others • Medium Criticality • A failure that can permanently damage components of the device • Low Criticality • A failure that would change the functionality of the device or affect its performance
Devices prone to fail • Freescale 9S12C32 microcontrollers • Murata OKR-T 5V switching regulator • BQ2002 Batter charging IC • L298 dual H-Bridge