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Tesla status

Tesla status. Petr Šícho Institute of Physics , AS CR, Prague. Noise problem. Seems to be understood  bias grid + clear correlation between V punch-trough and noise; For the wafers (from the Tesla second delivery ) used for assemblies for irradiations and test beam is:

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Tesla status

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  1. Tesla status Petr Šícho Institute of Physics, AS CR, Prague Petr Šícho, Institute of Physics, AS CR

  2. Noise problem • Seems to be understood  bias grid + clear correlation between Vpunch-trough and noise; • For the wafers (from the Tesla second delivery) used for assemblies for irradiations and test beam is: Vpunch-trough≈ 0 (measured 0.01-0.10 V) P-spray_High ≈ 3x1012/cm2 P-spray_Low ≈ 2x1011/cm2 (cca 7% of High) • For the wafers from Tesla first delivery we measured (unfortunately not irradiated and not used in test beam): Vpunch-trough≈ 3V P-spray_High ≈ 3x1012/cm2 P-spray_Low ≈ 1x1012/cm2 (cca 33% of High) Petr Šícho, Institute of Physics, AS CR

  3. Pixel insulation from the bias grid P-spray-high Insulation from the bias grid Bias grid Petr Šícho, Institute of Physics, AS CR

  4. Vpunch-through vs Vbias new old Petr Šícho, Institute of Physics, AS CR

  5. . Methodical exercise – 3 different regimes of Pspray (see previous figure) Petr Šícho, Institute of Physics, AS CR

  6. Improvement of sensor quality Example: I-V for SC Petr Šícho, Institute of Physics, AS CR

  7. Present status •  Pixel insulation of pixels from the bias grid solved; •  Improvement of sensor quality (leakage currents, Vbd); •  Production lots are in pipeline; expected delivery in the second half of January 2003. Petr Šícho, Institute of Physics, AS CR

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