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EDI Gun FM2 Performed Tests and Results

EDI Gun FM2 Performed Tests and Results. M . Steller Space Research Institute, Graz. Overview EDI Gun Tests. Components Level (valid for all FM’s) Radiation verification tests for bipolar transistors 2N2222 and 2N2907 Up-screening of components for HV opto -coupler

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EDI Gun FM2 Performed Tests and Results

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  1. EDI Gun FM2Performed Tests and Results M. Steller Space Research Institute, Graz IWF/ÖAW GRAZ

  2. Overview EDI Gun Tests • Components Level (valid for all FM’s) • Radiation verification tests for bipolar transistors 2N2222 and 2N2907 • Up-screening of components for HV opto-coupler • Electrical characterization and thermal cycling of HV opto-coupler • Board Level • Electrical test • Thermal test • Electronics Assembly • Electrical and functional test • Thermal cycling (not performed for FM2) • Assembled Gun • Short functional test (prior to calibration and transport) • Calibration • Reports available at: ftp://ftp.iwf.oeaw.ac.at/pub/EDI_MMS/EDI_FM2/GUN/ IWF/ÖAW GRAZ

  3. Radiation Verification Test • NPN Transistor 2N2222 • Two batches, two different lots • Dose rate 25krad/h = 6,94rad/sec • First batch: hFE ~150 => ~55 @75 krad • Second batch: hFE ~160 => ~25 @ 75krad • PNP Transistor 2N2907 • Two batches, two different lots • Dose rate 25krad/h = 6,94rad/sec • First batch: hFE ~200 => ~65 @75 krad • Second batch: hFE ~145 => ~50 @ 75krad IWF/ÖAW GRAZ

  4. Test & Assembly HVOC • Manufacturing flow • Adoption of Ir-LEDs to fit to the HV diode • Up-screening by external source • Assembly of Ir-LED with HV diode • Packing into housing IWF/ÖAW GRAZ

  5. Up-screeningof HVOC • Screening and serialization performed by SACTEC • Procedure follows IEEE-INST-002 (EDI-IWF-PRO-0028) • Mechanical tests were excluded Ir-Diode HV-Diode IWF/ÖAW GRAZ

  6. Selectionof HVOC • Electrical characterisation • Five HV levels 1kV to 5kV • Seven current levels for Ir-LED(1, 2, 5, 10, 15, 20, 25mA) • Detailed characterisation for selection (since FM3) • HV sweep from 0 to 5kV with 100V steps • Seven current levels for Ir-LED(1, 2, 5, 10, 15, 20, 25mA) IWF/ÖAW GRAZ

  7. Board Level Tests • Electrical Test • Board mounted onto dedicated test adapter with spring loaded electrical contacts • Standard BLT uses in- and output pins only • Additional test points in case detailed measurements necessary • Pre-defined step procedures • Test is performed semi-automatically • Scripts control stimuli and read-out • Scripts for generation of graphs IWF/ÖAW GRAZ

  8. Board Level Test DEFL1 • Functional Test • Supply current • REF voltage to HV controller (D2, D3, D6, D7) • Sweep input from 0 to 3.5V • Trimming in case deviation is larger than 0.2% • Sweep repeated in case of trimming • Check of resistor ring (generation of REF voltages) • Thermal Test • Ambient pressure, -20°C ... 70°C • Recording of HV output, HK values and supply currents • Report • EDI-IWF-REP-0264 IWF/ÖAW GRAZ

  9. Resultsfor DEFL1 • HV Outputs • Deflection D2: 0/+3000V => 0/+2998V • Deflection D3 : 0/+3000V => 0/+3004V • Deflection D6 : 0/+3000V => 0/+3006V • Deflection D7 : 0/+3005V => 0/+2997V • Inputs to HV Controller • Deflection D2: 998.6V => 997V 2501.4V => 2497V • Deflection D3: 998.6V => 998V 2501.4V => 2503V • Deflection D6: 998.6V => 999V 2501.4V => 2505V • Deflection D7: 998.6V => 996V 2501.4V => 2498V IWF/ÖAW GRAZ

  10. Board Level Test DEFL2 • Functional Test • Supply current • REF voltage to HV controller (D1, D4, D5, D8) • Sweep input from 0 to 3.5V • Trimming in case deviation is larger than 0.2% • Sweep repeated in case of trimming • Check of resistor ring (generation of REF voltages) • Check of HK multiplexer (test signal 3.5V) • Thermal Test • Ambient pressure, -20°C ... 70°C • Recording of HV output, HK values and supply currents • Report • EDI-IWF-REP-0265 IWF/ÖAW GRAZ

  11. Resultsfor DEFL2 • HV Outputs • Deflection D1: 0/+3000V => 0/+3006V • Deflection D4 : 0/+3000V => 0/+3002V • Deflection D5 : 0/+3000V => 0/+3000V • Deflection D8 : 0/+3005V => 0/+3005V • Inputs to HV Controller • Deflection D1: 998.6V => 999V 2501.4V => 2505V • Deflection D4: 998.6V => 999V 2501.4V => 2502V • Deflection D5: 998.6V => 997V 2501.4V => 2500V • Deflection D8: 998.6V => 999V 2501.4V => 2504V IWF/ÖAW GRAZ

  12. Board Level Test OPT_DEFL • Functional Test • Supply current • REF voltage to HV controller (UD, UI) • Sweep input from 0 to 3.5V • Trimming in case deviation is larger than 0.2% • Sweep repeated in case of trimming • Check of HK multiplexer (test signal 3.5V) • Calibration of temperature sensor • Thermal Test • Ambient pressure, -20°C ... 70°C • Recording of HV output, HK values and supply currents • Report • EDI-IWF-REP-0266 IWF/ÖAW GRAZ

  13. Resultsfor OPT_DEFL • HV Outputs • U_Deflector: 0/+3000V => -1/+3007V • U_Injector: 0/+2000V => 0/+2000V IWF/ÖAW GRAZ

  14. Board Level Test BEAM • Functional Test • Supply current • REF voltage to HV controller (Anode, Focus, Cathode) • Sweep input from -1.5 to 3.5V (range depends on channel) • Trimming in case deviation is larger than 0.2% • Sweep repeated in case of trimming • Timing measurement for chopper circuit • Report • EDI-IWF-REP-0263 IWF/ÖAW GRAZ

  15. Resultsfor BEAM • HV Outputs • Anode: 0/+3000V => 0/+3001V • Focus: 0/-1500V => 0/-1501V • Cathode: 0/-1500V => 0/-1498V • Chopper • Delay: 20.7ns • Rise time: <10ns => 2.0ns • Fall time: <10ns => 2.9ns IWF/ÖAW GRAZ

  16. Gun Electronics Assembly (1) • Integration steps for gun electronics stack • Beam board with external harness/ Optics deflection board / HV FIL board • First intermediate electrical test • Resonance frequency of HV converter, cascade output voltages • Functional test of beam and optics deflection • Filament supply and Wehnelt driver • Deflection1 and deflection 2 • Second intermediate electrical test • Check of external harness • Test of deflection system • Isolation test • Electric strength • Installation of deflection system IWF/ÖAW GRAZ

  17. Gun Electronics Assembly (2) • Functional test of gun electronics stack • Power consumption • All HV outputs: sweep from minimum to maximumRecord output and housekeeping • Test of chopper signalRise and fall time • Test of filament supplyFilament voltage and housekeeping • Test of Wehnelt driverVoltage versus HK frequency • Derive Anode voltage for beam energy 1keV, 500eV and 250eV • Electrode settling time for all HV outputs IWF/ÖAW GRAZ

  18. Resultsfrom Intermediate Tests • Functional test of gun electronics stack • Deviation of HV outputs • Deflection 2: max. -5V • Deflection 3: max. 8V • Deflection 6: max. 110V • Deflection 7: max. -5V • Deflection 1: max. 15V • Deflection 4: max. 10V • Deflection 5: max. 5V • Deflection 8: max. 38V • Anode: max. 5V • Cathode: max. 4V • Focus: max. 9V • Chopper signalRise and fall time <10ns: Rise 2.13ns, fall 2.35ns • Electrode settling time:<10ms full scale => < 1ms, for all outputs except Cathode IWF/ÖAW GRAZ

  19. GunCalibration • Preparation • Installation into chamber • Short functional test • Pumping after 2 hours OFF time • Preparation for Calibration • Adjustments for polar angle 0 • Reference position for movable platform (centre of target) • Calibration 1keV, 500eV, 250eV • Focus adjustment (0, 20, 40, 60, 80, 90°, 95° polar, every 30° azimuth) • Calibration of deflection system • Beam profile measurements (same position as focus adjustment) • Beam tests: Coding, beam split, maximum beam current IWF/ÖAW GRAZ

  20. ResultsfromCalibration • Calibration table • XD, YD for every polar angle ( 2° steps, 1° steps for polar angle above 70°) • Corrected polar angle • Content of calibration report • Deviation from theoretical formula • Beam current versus polar angle • Spatial deviation from reference • Content of calibration table displayed in graphs • Beam profiles (2D and 3D graphs) • Results from beam test • Report • EDI-IWF-REP-0281 (0081) IWF/ÖAW GRAZ

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