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Powering tests

Powering tests. Laura Gonella Physikalisches Institut Uni Bonn. Meaurements. For different powering configuration, measure. For now done on bare chips. Current PCB does not have circuitry for sensor HV. 43. 86.

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Powering tests

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  1. Powering tests Laura Gonella Physikalisches Institut Uni Bonn

  2. Meaurements • For different powering configuration, measure For now done on bare chips. Current PCB does not have circuitry for sensor HV. 43 86 VDDA2M is not connected on the PCB. It was removed to make space for regulator testing circuitry. Wire bond from VDDA pad to measurement point. Same for VDDD. L. Gonella - Powering tests

  3. Powering configurations L. Gonella - Powering tests

  4. Setup • Power is provided via power supply • USBpix is used only to send/receive signals to/from the chip • Stcontrol • Standard configuration file • Top row not powered • Switching on sequence • Power up chip. Both VDDA and VDDD applied at the same time • Start the clock via STcontrol • Configure • Run scans L. Gonella - Powering tests

  5. Direct powering configuration 1 L. Gonella - Powering tests

  6. Direct powering configuration 1 • Rwire = 0.2Ohm round trip Rwb Rwire Rpcb 1.5V Rwire Rpcb 1.2V Rwb L. Gonella - Powering tests

  7. Voltages and currents L. Gonella - Powering tests

  8. Digital and analog scans • Analog scan • Digital scan: The digital scan is fine when powering from USBPix. L. Gonella - Powering tests

  9. Threshold scan L. Gonella - Powering tests

  10. Threshold scan L. Gonella - Powering tests

  11. Threshold scan – PrmpVbp*2 L. Gonella - Powering tests

  12. Direct powering configuration 2 L. Gonella - Powering tests

  13. Direct powering configuration 2 • VDDD and VDDA shorted at supply • Rwire = 0.2Ohm round trip Rwb Rwire Rpcb 1.5V Rpcb Rwire Rwb L. Gonella - Powering tests

  14. Voltages and currents L. Gonella - Powering tests

  15. Digital and analog scan • Digital scan • Analog scan L. Gonella - Powering tests

  16. Threshold scan L. Gonella - Powering tests

  17. Threshold scan L. Gonella - Powering tests

  18. Threshold scan – PrmpVbp*2 L. Gonella - Powering tests

  19. Discussion with Mauro • Mauro could provide within one week from now • Board with LV PP2 regulator • Controller • Easy Labview interface • Type 2 cables • As we are interested in transients we would need some more realistic cables • Mauro said this might take an extra week to have • On top add time to get things to work in Bonn (max 1 week?) • Mauro offered to come to Bonn and help at the beginning of June • Option 1 (type 2 cables): tests could start in 2 weeks form now (2nd of June) • Option 2 (more realistic cables): tests could start in 3 weeks from now (9th of June) • These are anyway far from being definitive dates • I agreed with Mauro that I will call him after this meeting to tell him what we decided L. Gonella - Powering tests

  20. Future tests • I am willing to finish the tests of the powering configurations with what I have right now and do them again with what Mauro sends • Provided what I am doing now is interesting and we can wait toget stuff from Mauro • After that I will go on with tests on the Shunt-LDO regulator with main focus on the full shunt-LDO mode for serial powering • Tests of different powering configurations with modules will follow as well • I will be providing support to people working on developing the powering scheme for the IBL with the Shunt-LDO L. Gonella - Powering tests

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