1 / 36

E-Learning Environment for WEB-Based Study of Testing

E-Learning Environment for WEB-Based Study of Testing. R.Ubar 1 , A.Jutman 1 , J.Raik 1 , S.Kostin 1 , H.-D.Wuttke 2. 1 Dept. of Computer Engineering Tallinn University of Technology Estonia. 2 Dept. of Technical Informatics Technical University of Ilmenau Germany. Motivation.

bowie
Download Presentation

E-Learning Environment for WEB-Based Study of Testing

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. E-Learning Environment for WEB-Based Study of Testing R.Ubar1, A.Jutman1, J.Raik1, S.Kostin1, H.-D.Wuttke2 1Dept. of Computer Engineering Tallinn University of Technology Estonia 2Dept. of Technical Informatics Technical University of Ilmenau Germany

  2. Motivation • ITRS: semiconductor test is already one of key problems in current generation of VLSI chips and its importance will be growing • There is a strong demand for well-educated specialists in the area of IC and microelectronics testing • Interactive training tools as addendum to LMS are needed to facilitate teaching process • TUT has a 15 years tradition in developing training tools in microelectronic testing • Students develop the software themselves under supervision of graduate students and senior personnel

  3. Motivation • Cutting Edge Research • Needs custom developed algorithms and/or tools • PhD Students • Need to run their experiments • Undergraduate Students • Need introduction to the topic • Department • Needs training materials and research

  4. Outline • Different layers of the platform • HW tools • PC-based tools • Web interface • E-Learning tools • Conclusions and discussion

  5. Different layers of the platform Web Tools PC Tools Hardware Tools

  6. Main components of the platform • DefSim - an integrated measurement environment for physical defect study in CMOS circuits. • TurboTester – a research and training toolkit with extensive set of tools for digital test and design for testability • Web-based runtime interface for remote access to our tools • Java applets – illustrative e-learning software written specifically for the web • Other tools

  7. Different layers of the platform Web Tools PC Tools Hardware Tools

  8. Defect Study using DefSim • DefSim is an integrated circuit (ASIC) and a measurement equipmrnt for experimental study of CMOS defects. • The central element of the DefSim equipment is an educational IC with a large variety of shorts and opens physically inserted into a set of simple digital circuits. • The IC is attached to a dedicated measurement box serving as an interface to the computer. The box supports two measurement modes - voltage and IDDQ testing. http://www.defsim.com

  9. DefSim IC details • Standard industrial CMOS technology • Area 19.90 mm2 • Approx. 48000 transistors • 62 pins • JLCC68 package A built-in current monitor for IDDQ testing is implemented in each block.

  10. VDD Q X A B GND Implementation of defects NAND2 cell with floating gate

  11. VDD Q A B GND Implementation of defects NAND2 cell with D-S short (missing poly) • Altogether there are over 500 different defects on the chip • Implemented defects are shorts and opens in metal and poly layers • To be close to the silicon reality each cell is loaded and driven by standard non-inverting buffers

  12. DefSim in the classroom • With DefSim you can • Observe the truth table of correct circuit • Observe the truth table of defective circuit • Obtain defect/fault tables for all specific defects • Define test patterns automatically or manually • Activate IDDQ and voltage measurements • Study behavior of bridging and open faults • Study and compare different fault models

  13. DefSim lab environment “Plug and Play” – dedicated hardware and software

  14. Different layers of the platform Web Tools PC Tools Hardware Tools

  15. PC-Based Toolkit – Turbo Tester Hazard Analysis Data Multivalued Simulator Logic Simulator Test Generators Specifi- cation Test Set Design Defect Library Fault Simulator BIST Emulator Faulty Area Design Error Diagnosis Test Set Optimizer Fault Table Used in 100+ institutions in 40+ countries http://www.pld.ttu.ee/tt

  16. Algorithms: Deterministic Random Genetic Levels: Gate Macro RTL Circuits: Combinational Sequential Formats: EDIF AGM Hazard Analysis Data Multivalued Simulator Logic Simulator Test Generators Specifi- cation Test Set Design Defect Library Fault Simulator BIST Emulator Methods: BILBO CSTP Hybrid Fault models: Stuck-at faults Physical defects Faulty Area Test Set Optimizer Design Error Diagnosis Fault Table PC-Based Toolkit – Turbo Tester Used in 100+ institutions in 40+ countries http://www.pld.ttu.ee/tt

  17. Turbo Tester: Basic Facts • Freeware • Downloadable via the Web • Windows, Linux, UNIX/Solaris • EDIF design interface • ATPGs, BIST, simulators, test compaction • Provides homogeneous environment for research and training

  18. Different layers of the platform Web Tools PC Tools Hardware Tools

  19. BIST Control Unit Test Pattern Generator (PRPG) ........ BIST Memory Circuit Under Test (CUT) ........ Output Response Analyzer (MISR) BIST Analyzer: covered topics • Test Pattern Generators (PRPG): • LFSR • Modular LFSR • Cellular Automata • GLFSR • Weighted TPG • etc. • Combined Techniques (PRPG + Memory): • Reseeding • Multiple polynomial BIST • Hybrid BIST • Bit-Flipping BIST • Column matching BIST • etc. Typical BIST Architecture

  20. BIST Analyzer: covered topics • Embedded generators (PRPG) and their properties • PRPG optimization methodologies and algorithms • Combined BIST solutions (PRPG+memory) • Fault detection and diagnosis in BIST

  21. BIST Analyzer

  22. Different layers of the platform Web Tools PC Tools Hardware Tools

  23. Web Interface

  24. Different layers of the platform Web Tools PC Tools Hardware Tools

  25. E-Learning software on DFT http://www.pld.ttu.ee/applets

  26. Benefits of e-learning software • Essential supplement to the university lectures • Accessibility over Internet • Visual content (“Living Pictures”) • Comprehensive examples • Better organization of teaching materials • Based on free educational software • Distance learning & computer aided teaching • Easy to implement in other universities • Constantly updated

  27. Turbo Tester Turbo Tester Java Applets Test Generation Design for Testability Error Diagnosis Built-In Self-Test Test and Diagnostics Applet on Basics of Test & Diagnostics Schematic & DD Editor RTL Design and Test Applet on RTL Design and Test Group of Applets on Control Part Decomposition Applet on Boundary Scan Standard Boundary Scan Supporting Materials Scenario 1 Test Generation Scenario 2 Error Diagnosis Scenario 3 Built-In Self-Test Scenario 4 Design for Testability Learning Scenarios Scenario 1 Test Generation Scenario 2 Error Diagnosis Scenario 3 Built-In Self-Test Scenario 4 Design for Testability E-Learning Software Web based tools for classroom, home and exams Tools for laboratory research

  28. Logic leveldiagnostics System level test & DfT Boundary Scan E-Learning Software Software for classroom, home, labs and exams: http://www.pld.ttu.ee/applets

  29. Applet on basics of test • manual test pattern generation assisted by the applet • generation of pseudo-random test vectors by LFSR • fault simulation & study of fault table • combinational fault diagnosis using fault tables • sequential fault diagnosis by guided probing

  30. Applet on RT-level design and test • design of a data path and control path (microprogram) on RT level • investigation of tradeoffs between speed of the system & HW cost • RT-level simulation and validation • gate-level deterministic test generation and functional testing • fault simulation • logic and circular BIST, functional BIST, etc. • design for testability

  31. Applet on Boundary Scan • Simulation of operation of TAP Controller • Illustration of work of BS registers • Insertion and diagnosis of interconnection faults • Design/editing of BS structures using the BSDL language • Design/description of the target board using several chips

  32. Design for Testability AGM, GIF Applet on Basics of Test & Diagnostics Schematic & DD Editor AGM, DWG AGM, GIF Applet on RTL Design and Test AGM Applet on Boundary Scan Standard Schematic and DD editor • Main functions of the applet are: • gate-level schematic editor • SSBDD editor • schematic ↔ SSBDD on-the-fly • converter • different format reader/converter An applet targeted at binding all the applets and the Turbo Tester Supported interface formats are: AGM DWG VHDL GIF EDIF? PostScript?

  33. XTimport Tool Circuit Netlist Design Specification Design Implementation Intermediate Diagnosis Verification Results Final Diagnosis Diagnostic Vectors ATPG Prediag Tool Circuit Schematic Test Vector File Test Vector File Verification Tool Human Being Report File Vecmanager Tool Turbo Tester tools and formats Other Example of a lab work scenario

  34. Conclusions The main features of the platform: • Research engine + training software • Layered structure • HW and SW components • Remote access • Distance learning and e-learning • Computer-aided teaching • Freeware

  35. Conclusions

  36. Our Tools on the Web The Turbo Tester home page http://www.pld.ttu.ee/tt/ The Turbo Tester web-server page http://www.pld.ttu.ee/webtt/ DefSim home page http://www.defsim.com Java applets home page http://www.pld.ttu.ee/applets/

More Related