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APV25 noise evaluation

APV25 noise evaluation. 2005/12/07 SVD upgrade meeting S.Ono(TIT). Noise from detector capacitance Noise from leak current. APV Noise measurement peaking time: Tp=35ns~200ns APV chip bonded to only pitch adaptor -> C D , I leak are very small. Shaping curve. Tp=50ns.

brett-stevenson
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APV25 noise evaluation

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  1. APV25 noise evaluation 2005/12/07 SVD upgrade meeting S.Ono(TIT)

  2. Noise from detector capacitance Noise from leak current • APV Noise measurement peaking time: Tp=35ns~200ns • APV chip bonded to only pitchadaptor -> CD, Ileak are very small

  3. Shaping curve Tp=50ns Tp=100ns Tp=150ns Tp=200ns Fitting function:

  4. Noise vs. peaking time Noise: averaged each chip Peaking time: calculated from fitting 1 ADC count ~ 200 electrons Chip 1 Chip 2 Chip 3 Chip 4

  5. summary • Noise have decreased with peaking time rising (decreasing is very small because of small capacitance) • Leak current flowed little, so shot noise were small and APV noise have not increased at long peaking time

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