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Preliminary Ladder Testing Results (part 2). At IPHC MS, XS, LG. Outline. New running conditions Noise and FPN Offset variation Normal readout mode Self-induced noise Ladder induced noise. New running conditions. Using EX354RT lab power supply for VDD ladder and VDD buffers.
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Preliminary Ladder Testing Results(part 2) At IPHC MS, XS, LG
Outline New running conditions Noise and FPN Offset variation Normal readout mode • Self-induced noise • Ladder induced noise
New running conditions • Using EX354RT lab power supply for VDD ladder and VDD buffers. • Developed noise pickup (?) that triggers overcurrent protection on our standard power modules • Added 9 × 100 nF decoupling capacitors on VDD (1 per sensor, except for sensor 5) • Bypassed bond wires for VDD and GND
Normal mode readout: self-induced noise (sub-array A fixed threshold @ 5× ) Sensor 2, others HIGH thresholds 9
Ladder induced noise Sensor 2, others LOW thresholds Sensor 2 thresholds: 5×, - 1 mV, -2 mV
Summary • Significant improvement with 9 decoupling capacitors • Additional testing needed with full capacitor complement • Including repeatability • Implications for ladder design: • TBD but likely a separate-power cable version