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Ladder Testing at IPHC (Preliminary Results). Outline. Running conditions Threshold scan repeatability (initial) Noise and FPN performance Additional studies (normal RDO mode) Noise and FPN in two operating states Threshold offset in two operating states Summary. Running conditions.
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Outline Running conditions Threshold scan repeatability (initial) Noise and FPN performance Additional studies (normal RDO mode) Noise and FPN in two operating states Threshold offset in two operating states Summary
Running conditions • Using EX354RT lab power supply for VDD ladder and VDD buffers. • 9 × 100 nF decoupling capacitors on VDD (1 per sensor, except for sensor 5) • Bypassed bond wires for VDD and GND NEW: • 2 × 100 nF decoupling capacitors on VCLP (sensors 3 (C7) and 4 (D3)
Additional studies (normal RDO mode) • ALL LOW ALL HIGH ALL LOW PATT • ALL HIGH PATT single 3.28 V single 3.68 V • ALL LOW PATT 2 JTAG ALL LOW PATT seq. START ALL LOW seq. START
Additional studies (normal RDO mode) • ALL LOW seq. START& JTAG ALL LOW PATT (GND) ALL LOW (GND) • ALL LOW (GND) seq. START&JTAG ALL LOW (8 hrs, only 1 RSTB)
Noise and FPN in two operating states (Other 9 sensors LOW thresholds (VREF1=0))
Summary • We observe offset and noise instability in certain sensors running in a ladder configuration • RSTB is what sends the sensor(s) into other states • Noise variation ~ 0.6 • Offset variation < 6 (8) DAC <2 mV • No such effects observed when operating only one sensor • Are there additional tests that can help characterize this behavior in hopes of understanding if it is an aspect of the sensor design? • We need to understand the impact of these variations on the PXL detector performance. • We will be running the thinned ladder remotely from IPHC and doing a similar set of testing
Backup • Previous results: • noise + FPN • Offset variation • Offset change lower noise?