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Preliminary Ladder Testing Results

Preliminary Ladder Testing Results. At IPHC MS, XS, LG. Outline. Ladders Testing Goals Voltage, power and temperature on ladder Baseline comparisons to probe test results Sensor performance in ladder configuration Issues What we have learned? Future testing. Ladders.

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Preliminary Ladder Testing Results

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  1. Preliminary Ladder Testing Results At IPHC MS, XS, LG

  2. Outline Ladders Testing Goals Voltage, power and temperature on ladder Baseline comparisons to probe test results Sensor performance in ladder configuration Issues What we have learned? Future testing

  3. Ladders Thin and thick sensor ladders. Large bypass caps at either end, no small bypass caps (pads area available for VDDA, VDDD, VCLP). Hand assembled quickly from probe tested sensors that function but have not been extensively characterized and are not necessarily optimum. Tested at LBNL for JTAG function, test mode line pattern, normal mode readout was checked for proper header pattern. Ladders were then shipped to IPHC. Probe system used primarily test modes. Normal RDO mode implemented(mostly) at IPHC.

  4. Testing goals Validate the cable design Cable design driven by mechanical requirements Test results from Phase-1 sensor ladders Expected large power consumption at startup Basic funcitonality (JTAG, Power distribution, etc.) Characterization of sensor performance Test mode Normal readout mode As a function of bypass capacitance

  5. Voltage, power and temperature on ladder

  6. Voltage, power and temperature on ladder

  7. Voltage, power and temperature on ladder Cooling liquid @ 22.5 °C

  8. Baseline comparisons to probe test results No damage during shipping • JTAG and basic functionality Sensor damage during construction: • 1 sensor on the “thick” ladder (L1) • 2 senosrs on the “thin” ladder (L2) • We suspect VCLP failure – to be tested later

  9. Baseline comparisons to probe test results

  10. Sensor performance in ladder configuration

  11. Issues: threshold shift

  12. Issues: self-induced noise 13

  13. Issues: missing header/trailer bits

  14. What we have learned? We need to work on our probe testing to be sure that we are getting good results. We need to be more careful of ESD during ladder construction. The voltage drop on the ladders appears to be manageable. The threshold baseline shifts with applied VDD and noise. Self induced sensor noise is possible. The noise observed without any bypassing capacitors in the sensor array is significant. Additional testing is needed

  15. Future testing Add bypass capacitors Retest existing ladders In parallel, design split-power cable Assemble split-power ladder in Berkeley Continue intensive testing at LBL

  16. Discussion points Additional measurments An onboard regulator may help with the threshold shifts and with noise immunity, but at the cost of power dissipation …

  17. Back up slides

  18. Issues: ladder induced noise ?

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