1 / 11

Surface Mount Technology (SMT) experiment - problem solving in a manufacturing environment

Surface Mount Technology (SMT) experiment - problem solving in a manufacturing environment. 2 types of defects, probably related - Solder balls - Solder-on-gold Statistician invited in for a “quick fix” experiment High volume memory card product. Problem in screening / reflow operations.

ianthe
Download Presentation

Surface Mount Technology (SMT) experiment - problem solving in a manufacturing environment

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. Surface Mount Technology (SMT) experiment - problem solving in a manufacturing environment • 2 types of defects, probably related • - Solder balls • - Solder-on-gold • Statistician invited in for a “quick fix” experiment • High volume memory card product

  2. Problem in screening / reflow operations Solder paste screening Component placement Prep card Solder paste reflow Clean card Inspect (T2) insert Inspect (T1)

  3. 8 potential process factors • Clean stencil frequency: 1/1, 1/10 • Panel washed: no, yes • Misregistration: 0, 10 ml • Paste height: 9ml, 12 ml • Time between screen/ reflow: .5, 4 hr • Reflow card spacing: 18 in, 36 in • Reflow pre-heat: cold, hot • Oven: A, B

  4. Experiment design conditions • Resources only permit 16 trials • Get efficiency from 2-level factors • Measure both types of defects • Introduce T1 inspection station for counting defects • Same inspectors • Same quantity of cards per trial

  5. Can we measure effects of 8 factors in 16 trials? Yes

  6. 7 more columns contain all interactions • Each column contains confounded interactions

  7. Normal plot for factor effects on solder ball defects C D CD

  8. Which confounded interaction is significant? • AF, BE, CD, or GH ? • The main effects C and D are significant, so engineering judgement tells us CD is the true significant interaction. • C is misregistration • D is paste height

  9. Conclusions from experiment • Increased paste height (D+) acts together with misregistration to increase the area of paste outside of the pad, leading to solder balls of dislodged extra paste. • Solder ball occurrence can be reduced by minimizing the surface area and mass of paste outside the pad.

  10. Implemented solutions • Reduce variability and increase accuracy in registration. • Lowered solder ball rate by 77% • More complete solution: • Shrink paste stencil opening - pad accommodates variability in registration.

  11. The Power of Efficient Experiments • More information from less resources • Thought process of experiment design brings out: • potential factors • relevant measurements • attention to variability • discipline to experiment trials

More Related