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Y.C. TaiCaltech Micromachining Lab. 2. MEMS Material. Electrical Properties -- available data base from ICChemical Properties -- available data base from ICMechanical Properties ? usually lack of data base-- Young's modulus, Ey-- Poisson's ration, n-- Residual stress, s-- Fracture str
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1. Y.C. Tai
Caltech Micromachining Lab 1 MEMS MATERIALS
2. Y.C. Tai
Caltech Micromachining Lab 2 MEMS Material Electrical Properties -- available data base from IC
Chemical Properties -- available data base from IC
Mechanical Properties – usually lack of data base
-- Young’s modulus, Ey
-- Poisson’s ration, n
-- Residual stress, s
-- Fracture strength, sf
-- Fatigue?
3. Y.C. Tai
Caltech Micromachining Lab 3 Single-Crystal Silicon (1) Diamond-structure with 8 atoms per cell.
Lattice spacing = 5.43 Å at room temp.
Brittle material, but will plastically deform when stressed at high temperature (>900°C).
4. Y.C. Tai
Caltech Micromachining Lab 4 Single-Crystal Silicon (2)
5. Y.C. Tai
Caltech Micromachining Lab 5 Polycrystalline Silicon (Polysilicon) Ideal Properties
Zero built-in stress & stress gradient
Predictable mechanical & electrical properties
Achievable Properties:
Built-in stress = –20 MPa, near-zero gradient
E = 160 ± 10 GPa, grain sizes, orientation controllable
Conductivity = 0.1 mW·cm to intrinsic
6. Y.C. Tai
Caltech Micromachining Lab 6 Best Mechanical Properties achieved by Deposition Temperature:
Just below the amorphous-to-crystalline transition (590°C) followed by annealing at 1050°C for 1 hour.
Deposition Pressure:
200 ± 50 mTorr
Deposition Chemistry:
SiH4 diluted in H2 carrier, undoped or post-dep doped.
Results:
Built-in stress at –20 MPa
Best film uniformity, quality, and step coverage
Random crystallite orientation Þ isotropic mechanical properties
7. Y.C. Tai
Caltech Micromachining Lab 7
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Caltech Micromachining Lab 8
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Caltech Micromachining Lab 9
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Caltech Micromachining Lab 10
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Caltech Micromachining Lab 11
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Caltech Micromachining Lab 12 Other Materials Piezoelectrics: Quartz, ZnO, PZT, AlN
SiC: CVD (1,200-1,400°C)
Diamond Films: CVD
Metals: Al, Ni, NiFe, Cu, Au, Hg
Polymers: SU8, Parylene, PDMS
13. Y.C. Tai
Caltech Micromachining Lab 13 Material Testing methods
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Caltech Micromachining Lab 14 Beam Load-Deflection Method
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Caltech Micromachining Lab 15 Buckling Fracture Method
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Caltech Micromachining Lab 16 Wafer Warpage Method
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Caltech Micromachining Lab 17 Diaphragm Load-Deflection method
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Caltech Micromachining Lab 19 Electrostatic Pull-in Method