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This course covers power and ground distribution in advanced VLSI designs, including power supply noise, switching transients, decoupling capacitors, and power grid layout considerations.
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ELEC 7770Advanced VLSI DesignSpring 2016Power and Ground Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University Auburn, AL 36849 vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal/COURSE/E7770_Spr16 ELEC 7770: Advanced VLSI Design (Agrawal)
References Q. K. Zhu, Power Distribution Network Design for VLSI, Hoboken, New Jersey: Wiley, 2004. M. Popovich, A. Mezhiba and E. G. Friedman, Power Distribution Networks with On-Chip Decoupling Capacitors, Springer, 2008. C.-K. Koh, J. Jain and S. F. Cauley, “Synthesis of Clock and Power/Ground Network,” Chapter 13, L.-T. Wang, Y.-W. Chang and K.-T. Cheng (Editors), Electronic Design Automation, Morgan-Kaufmann, 2009. pp. 751-850. J. Fu, Z. Luo, X. Hong, Y. Cai, S. X.-D. Tan, Z. Pan, “VLSI On-Chip Power/Ground Network Optimization Considering Decap Leakage Currents,” Proc. Asia and South Pacific Design Automation Conf., 2005, pp. 735-738. Decoupling Capacitors, http://www.vlsichipdesign.com/index.php/Chip-Design-Articles/decoupling-capacitors.html ELEC 7770: Advanced VLSI Design (Agrawal)
Supply Voltage 3.0 2.5 2.0 1.5 1.0 0.5 0.0 Supply voltage (V) 0.25 0.18 0.13 0.1 Minimum feature size (μm) ELEC 7770: Advanced VLSI Design (Agrawal)
Gate Oxide Thickness 60 50 40 30 20 10 0 Gate oxide thickness (A) High gate leakage 0.25 0.18 0.13 0.1 Minimum feature size (μm) ELEC 7770: Advanced VLSI Design (Agrawal)
Power Supply Noise • Transient behavior of supply voltage and ground level. • Caused by transient currents: • Power droop • Ground bounce ELEC 7770: Advanced VLSI Design (Agrawal)
Power Supply V(t) Rg + – R C R C VDD Gate 2 Gate 1 ELEC 7770: Advanced VLSI Design (Agrawal)
Switching Transients VDD VDD[1 – Rg/(R+Rg)] V(t) 0 time, t Only Gate 1 switches (turns on): V(t) = VDD – Rg VDD exp[– t/{C(R+Rg)}]/(R+Rg) ELEC 7770: Advanced VLSI Design (Agrawal)
Multiple Gates Switching VDD 1 2 3 Gate output voltage Number of gates switching many 0 time, t ELEC 7770: Advanced VLSI Design (Agrawal)
Decoupling Capacitor i(t) VL(t) t=0 a Rg VDD = 1 t=0 t + – Rd Cd IL A capacitor to isolate two electrical circuits. Illustration: An approximate model: ELEC 7770: Advanced VLSI Design (Agrawal)
Approximate Load Current, IL 0, t < 0 at, t < tp IL = a(2tp – t), t < 2tp 0, t > 2tp ELEC 7770: Advanced VLSI Design (Agrawal)
Transient Load Voltage VL(t) = 1 – a Rg [ t – CdRg (1 – e – t/T) ], 0 < t < tp T = Cd (Rg + Rd) ELEC 7770: Advanced VLSI Design (Agrawal)
Realizing Decoupling Capacitor VDD VDD OR S B D S B D GND GND ELEC 7770: Advanced VLSI Design (Agrawal)
Capacitance Cd = γ×WL×ε×ε0/Tox ≈ 0.26fF, for 70nm BSIM L = 38nm, W = 200nm γ = 1.5462 ε = 4 ELEC 7770: Advanced VLSI Design (Agrawal)
Leakage Resistance Igate = α× e – βTox×W where α and β are technology parameters. Rd = VL(t)/Igate Because V(t) is a function of time, Rd is difficult to estimate. The decoupling capacitance is simulated in spice. ELEC 7770: Advanced VLSI Design (Agrawal)
Power-Ground Layout Solder bump pads Vss Vss Vdd M5 Vdd/Vss supply Vdd/Vss equalization M4 Via Vss Vdd Vdd ELEC 7770: Advanced VLSI Design (Agrawal)
Power Grid + – ELEC 7770: Advanced VLSI Design (Agrawal)
Nodal Analysis V2 g2 g1 g3 Vi V1 V3 g4 Ci Apply KCL to node i: 4 ∑ (Vk – Vi) gk – Ci ∂Vi/∂t = Bi k=1 Bi V4 ELEC 7770: Advanced VLSI Design (Agrawal)
Nodal Analysis G V – C V’ = B Where G is conductance matrix V is nodal voltage vector C is capacitance matrix B is vector of currents V(t) is a function of time, V(0) = VDD B(t) is a function of time, B(0) ≈ 0 or leakage current ELEC 7770: Advanced VLSI Design (Agrawal)
Wire Width Considerations • Increase wire width to reduce resistance: • Control voltage drop for given current • Reduce resistive loss • Reduce wire width to reduce wiring area. • Minimum width restricted to avoid metal migration (reliability consideration). ELEC 7770: Advanced VLSI Design (Agrawal)
A Minimization Problem Minimize total metal area: n n A = ∑ wi si = ∑ | ρ Ci si2 | / xi i=1 i=1 Where n = number of branches in power network wi = metal width of ith branch si = length of ith branch ρ = metal resistivity Ci = maximum current in ith branch xi = voltage drop in ith branch Subject to several conditions. ELEC 7770: Advanced VLSI Design (Agrawal)
Condition 1: Voltage Drop Voltage drop on path Pk: ∑ xi ≤ Δvk i ε Pk Where Δvk = maximum allowable voltage drop on kth path ELEC 7770: Advanced VLSI Design (Agrawal)
Condition 2: Minimum Width Minimum width allowed by fabrication process: wi = ρ Ci si / xi ≥ W Where wi = metal width of ith branch si = length of ith branch ρ = metal resistivity Ci = maximum current in ith branch xi = voltage drop in ith branch W = minimum line width ELEC 7770: Advanced VLSI Design (Agrawal)
Condition 3: Metal Migration Do not exceed maximum current to wire-width ratio: Ci / wi = xi /(ρsi) ≤ σi Where wi = metal width of ith branch si = length of ith branch ρ = metal resistivity Ci = maximum current in ith branch xi = voltage drop in ith branch σi = maximum allowable current density across ith branch ELEC 7770: Advanced VLSI Design (Agrawal)
Decoupling Capacitance Rg VDD + – Cd I(t) ELEC 7770: Advanced VLSI Design (Agrawal)
Decoupling Capacitance Initial charge on Cd, Q0 = Cd VDD I(t): current waveform at a node T: duration of current Total charge supplied to load: T Q = ∫ I(t) dt 0 ELEC 7770: Advanced VLSI Design (Agrawal)
Decoupling Capacitance Assume that charge is completely supplied by Cd. Remaining charge on Cd = Cd VDD – Q Voltage of supply node = VDD – Q/Cd For a maximum supply noise ΔVDDmax, VDD – (VDD – Q/Cd) ≤ ΔVDDmax Or Cd ≥ Q / ΔVDDmax ELEC 7770: Advanced VLSI Design (Agrawal)
A High-Voltage On-Chip Power Distribution Network Master’s Thesis www.eng.auburn.edu/~vagrawal/THESIS/SHIHAB/Mustafa_Thesis.pdf Mustafa M. Shihab Auburn University ECE Department June 2013 June 28, 2013 ELEC 7770: Advanced VLSI Design (Agrawal)
Power Distribution ‘Grid’: Source: N. Weste et al., CMOS VLSI design: A Circuits and Systems ELEC 7770: Advanced VLSI Design (Agrawal)
Take Away: For a 100 mile long line carrying 1000 MW of energy @ 138 kV power loss = 26.25% @ 345 kV power loss = 4.2% @ 765 kV power loss = 1.1% to 0.5% Source: “American Electric Power Transmission Facts “, http://bit.ly/11nUMvf ELEC 7770: Advanced VLSI Design (Agrawal)
I2R Loss in On-Chip Power Distribution Network: ELEC 7770: Advanced VLSI Design (Agrawal)
Propose a scheme for delivering power to different parts of a large integrated circuit, such as cores on a system-on-chip (SoC), at a higher than the regular (VDD) voltage. The increase in voltage will lower the current on the grid, and thereby reduces the I2R loss in the on-chip power distribution network. ELEC 7770: Advanced VLSI Design (Agrawal)
Example: Low-Voltage (VDD) Power Grid with 9 loads ELEC 7770: Advanced VLSI Design (Agrawal)
Example: High-Voltage (3V) Power Grid with 9 loads ELEC 7770: Advanced VLSI Design (Agrawal)
Supply Voltage: 1V, Load: 1W Grid Resistances: 0.5 Ω (ITRS 2012) ELEC 7770: Advanced VLSI Design (Agrawal)
Supply Voltage: 3 V, Load: 1W Grid Resistances: 0.5 Ω (ITRS 2012) DC-DC Converter: LTC 3411-A Linear Technology, 100% Efficiency ELEC 7770: Advanced VLSI Design (Agrawal)
Supply Voltage: 3 V, Load: 1W Grid Resistances: 0.5 Ω (ITRS 2012) DC-DC Converter: LTC 3411-A Linear Technology, 80% Efficiency ELEC 7770: Advanced VLSI Design (Agrawal)
DC-DC Converter Design: • Efficiency • Power • Area • Output Drive Capacity • Fabrication ELEC 7770: Advanced VLSI Design (Agrawal)
Sources: B. Maity et al., Journal of Low Power Electronics 2012 V. Kursun et al., Multi-voltage CMOS Circuit Design. Wiley, 2006 • Input Voltage: 3.3 V Output Voltage: 1.3 V – 1.6 V Output Drive Current: 26 mA Efficiency: 75% - 87% • Input Voltage: 3.6 V & 5.4 V Output Voltage: 0.9 V Output Drive Current: 250 mA Efficiency: 87.8% & 79.6% ELEC 7770: Advanced VLSI Design (Agrawal)