200 likes | 370 Views
MonolithIC 3D ICs. RCAT Flow. MonolithIC 3D Inc. , Patents Pending. Monolithic 3D ICs.
E N D
MonolithIC 3D ICs RCAT Flow MonolithIC 3D Inc. , Patents Pending MonolithIC 3D Inc. , Patents Pending
Monolithic 3D ICs Using SmartCut technology - the ion cutting process that Soitec uses to make SOI wafers for AMD and IBM (million of wafers had utilized the process over the last 20 years) - to stack up consecutive layers of active silicon (bond first and then cut). Soitec’s Smart Cut Patented* Flow(access the link for video). *Soitec’s fundamental patent US 5,374,564 expired Sep. 15, 2012 MonolithIC 3D Inc. , Patents Pending
Monolithic 3D ICs Ion cutting: the key idea is that if you implant a thin layer of H+ ions into a single crystal of silicon, the ions will weaken the bonds between the neighboring silicon atoms, creating a fracture plane (Figure 3). Judicious force will then precisely break the wafer at the plane of the H+ implant, allowing you to in effect peel off very thin layer. This technique is currently being used to produce the most advanced transistors (Fully Depleted SOI, UTBB transistors – Ultra Thin Body and BOX), forming monocrystalline silicon layers that are less than 10nm thick. MonolithIC 3D Inc. , Patents Pending
Figure 3Using ion-cutting to place a thin layer of monocrystalline silicon above a processed (transistors and metallization) base wafer Cleave using <400oC anneal or sideways mechanical force. CMP. Hydrogen implant of top layer Flip top layer and bond to bottom layer Oxide p- Si Top layer Oxide p- Si H p- Si H p- Si Oxide Oxide Oxide Oxide Oxide Bottom layer Similar process (bulk-to-bulk) used for manufacturing all SOI wafers today MonolithIC 3D Inc. , Patents Pending
MonolithIC 3D – The RCAT path • The Recessed Channel Array Transistor (RCAT) fits very nicely into the hot-cold process flow partition • RCAT is the transistor used in commercial DRAM as its 3D channel overcomes the short channel effect • Used in DRAM production @ 90nm, 60nm, 50nm nodes • Higher capacitance, but less leakage, same drive current The following slides present the flow to process an RCAT without exceeding the 400ºC temperature limit MonolithIC 3D Inc. , Patents Pending
RCAT – a monolithic process flow Using a new wafer, construct dopant regions in top ~100nm and activate at ~1000º C Oxide P- ~100nm N+ P- Wafer, ~700µm MonolithIC 3D Inc. , Patents Pending 6
Implant Hydrogen for Ion-Cut H+ Oxide P- ~100nm N+ P- Wafer, ~700µm MonolithIC 3D Inc. Patents Pending
H+ Hydrogen cleave plane for Ion-Cut formed in donor wafer Oxide P- ~100nm N+ ~10nm P- Wafer, ~700µm MonolithIC 3D Inc. Patents Pending
H+ Flip over and bond the donor wafer to the base (acceptor) wafer Donor Wafer, ~700µm N+ ~100nm P- Oxide 1µ Top Portion of Base Wafer Base Wafer, ~700µm MonolithIC 3D Inc. Patents Pending
Perform Ion-Cut Cleave N+ ~100nm P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 10
Complete Ion-Cut N+ ~100nm P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 11
Etch Isolation regions as the first step to define RCAT transistors N+ ~100nm P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 12
Fill isolation regions (STI-Shallow Trench Isolation) with Oxide, and CMP N+ ~100nm P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 13
Etch RCAT Gate Regions Gate region N+ ~100nm P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 14
Form Gate Oxide N+ ~100nm P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 15
Form Gate Electrode N+ ~100nm P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 16
Add Dielectric and CMP N+ ~100nm P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 17
Etch Thru-Layer-Via and RCAT Transistor Contacts N+ ~100nm P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 18
Fill in Copper N+ ~100nm P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 19
Add more layers monolithically N+ ~100nm P- Oxide N+ ~100nm P- Oxide 1µ Top Portion of Base (acceptor) Wafer Base Wafer ~700µm 20 MonolithIC 3D Inc. Patents Pending