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Radiation Damage Studies for Solid State Sensors Subject to MRaD Doses [T506 2014 Follow-on]

Explore radiation exposure and damage on solid state sensors subjected to MRad doses, with emphasis on ILC BeamCal and hadronic processes in EM showers. Includes proposed radiator configuration and exposure rates. Recent testing results and future goals are discussed.

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Radiation Damage Studies for Solid State Sensors Subject to MRaD Doses [T506 2014 Follow-on]

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  1. Radiation Damage Studies for Solid State Sensors Subject to MRaD Doses [T506 2014 Follow-on] Bruce Schum UC Santa Cruz April 16 2014

  2. The Issue: ILC BeamCal Radiation Exposure ILC BeamCal: Covers between 5 and 40 miliradians Radiation doses up to 100 MRad per year Radiation initiated by electromagnetic particles (most extant studies for hadron –induced) EM particles do little damage; might damage be come from small hadronic component of shower? 2

  3. Hadronic Processes in EM Showers There seem to be three main processes for generating hadrons in EM showers (all induced by photons): • Nuclear (“giant dipole”) resonances Resonance at 10-20 MeV (~Ecritical) • Photoproduction Threshold seems to be about 200 MeV • Nuclear Compton scattering Threshold at about 10 MeV;  resonance at 340 MeV  These are largely isotropic; must have most of hadronic component develop near sample 3

  4. Hadronic Processes in EM Showers Up to 100W beam absorption; operate below freezing to avoid annealing Status: Thermal prototype under testing at SCIPP 4

  5. Proposed split radiator configuration 5mm Tungsten “pre” 13mm Tungsten “post” Separated by 1m Fluence (particles per cm2) 1.0 2.0 3.0 5 Radius (cm)

  6. Charge Collection Apparatus Sensors DAQ FPGA with Ethernet Sensor + FE ASIC Recently upgraded for multiple samples • P-type and N-type sensors • Float-zone and Magnetic Czochralski bulk • Will maintain 0-5o C during irradiation • Continue studies begin in 2013 6

  7. Rastering Need uniform illumination over 0.25x0.75 cmregion (active area of SCIPP’s charge collection measurement apparatus). • Raster in 0.05cm steps over 1x1 cm, assuming fluence profile on prior slide (see next slide for result) Exposure rate: e.g. 1 MRad at 0.1 nA of 4 GeV e-  ~ 1.5 Hrs

  8. Current Run Beam energy has been low: 3.0 GeV At these energies, exposure rate falls off faster than linearly due to migration of shower max. Exposure rate estimate: 125 rad per 150 pC pulse, or about 2.3 Mrad per hour  roughly 20 Mrad per shift

  9. Irradiation Runs from 2013 Run of T506 (4 running periods in June and July 2013)

  10. Results: PF sensors (un-annealed) 10

  11. RUN ACTIVITY We 4/16 Began installation (open access) Th 4/17 Search and secure early afternoon; completed installation in controlled access. Alignment beam delivered and misalignments measured. Fr 4/18 Controlled access to raise platform; final alignment with magnet mover. Place PF sample, tungsten radiators and set up rastering and cooling. A-line set up. Accumulate 13:00 – 21:00.  16 Mrad Sa 4/19 Continue exposure 11:30 – 21:00  19 Mrad Su 4/20 Continue exposure 11:30 – 19:00  XXX Mrad Mo 4/21 Move apparatus off beamline for a few hours; return and accumulate until 21:00

  12. Other 2013 T506 Goals  Continue high-fluence studies DUBNA (Russia) has developed bulk (non-diode) GaAs sensors as alternative for BeamCal  Explore radation hardness of DUBNA pad sensors (in hand; modifying charge-collection apparatus for single-panel pad sensors rather than strip sensors)

  13. Results: NC sensors 13

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