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Minimalist Analog-to-Digital Converter Structures. Allen Waters. March 2 nd , 2012 School of EECS Oregon State University. Presentation Outline. Motivation Minimalist Quantizers Techniques to Improve Resolution Automating Analog Design Proposed Structure Conclusions.
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Minimalist Analog-to-Digital Converter Structures Allen Waters March 2nd, 2012 School of EECS Oregon State University
Presentation Outline • Motivation • Minimalist Quantizers • Techniques to Improve Resolution • Automating Analog Design • Proposed Structure • Conclusions 2012-03-02
Motivation: Process Scaling Digital circuits: • Faster • Denser • Port rapidly Analog circuits: • Lower gmro intrinsic gain • More variability • Reduced headroom • Porting is tedious • How can ADCs keep up with digital circuits? • Need architecture that is immune to analog component mismatch and variations • Minimalism sacrifices performance to improve portability and scaling • Ideally, would include in existing digital synthesis and place-and-route toolchain 2012-03-02
Presentation Outline • Motivation • Minimalist Quantizers • Techniques to Improve Resolution • Automating Analog Design • Proposed Structure • Conclusions 2012-03-02
Generic Flash Quantizer • Increasing resolution is expensive • Require k = 2N-1comparators for N-bit resolution • Requires analog references • Matching requirements for reference ladder • As processes scale, Vdd decreases and deviation in comparator offset increases • Higher probability of metastability [1] • Degrades linearity • Possible non-monotonicity [2] Scales poorly with both resolution and process 2012-03-02
Minimalist Flash Design • 3-level flash sacrifices resolution for other benefits • Minimal hardware • Reduced probability of metastability • Corresponding 3-level DAC simply switches among Vdd, Vss, Vcm; no added references • Need analog references, but only 2 of them How to avoid providing voltage references? 2012-03-02
Flash with Time-Domain Comparator • Single voltage comparator • Compare elapsed time before comparator resolves against reference time delay • No reference voltage • Accounts for metastability • Offset in voltage comparator can be tolerated [3] 2012-03-02
Flash with Time-Domain Comparator [3] No more minimal than 3-level flash Allen Waters • Single voltage comparator • Compare elapsed time before comparator resolves against reference time delay • No reference voltage • Accounts for metastability • Offset in voltage comparator can be tolerated • Now need to provide time delay reference 2012-03-02 8
Flash with Built-In Reference Voltage • Intentionally size input transistors differently • Creates a built-in comparator offset • Removes reference ladder • Removes differential input pair & branch current • Can add resolution using 2nd comparator cell 2012-03-02
VCO-Based Quantizer • Input voltage determines time delay of inverters (VTC) • Count inverter transitions occurring within fixed clock period (TDC) • Highly digital • Inherent 1st-order noise shaping • Implicit barrel shifting and DEM • VTC has poor linearity [4,5] 2012-03-02
Integrating Quantizer • Sample input voltage onto feedback capacitor • Apply constant discharging current until capacitor voltage is reaches zero (VTC) • Count fixed clock periods occurring within variable discharging time (TDC) • Inherent 1st-order noise shaping • Residue available as both voltage and time-domain signal • Requires opamp for integrator [6] 2012-03-02
Minimalist Opamp Design For minimalist design: • Single-stage amplifier • No cascoding (preserve headroom for low-voltage processes) 2012-03-02
Integrating Quantizer without Opamp • Single sampling capacitor and discharging current source • Avoids using opamp • Residue available as both voltage* and time-domain signal • Lose noise shaping • Linearity requirements on current source *if current source remains linear [8] 2012-03-02
Summary of Minimalist Quantizers • Flash with built-in references • Fast and simple, but low resolution • VCO-based quantizer • Highly digital, but nonlinear • Integrating quantizer • Residue voltage/time available, but relies on analog component matching • First-order noise shaping with opamp Decreasing minimalism Improve resolution by reducing “counting” element delay 2012-03-02
Presentation Outline • Motivation • Minimalist Quantizers • Techniques to Improve Resolution • Automating Analog Design • Proposed Structure • Conclusions 2012-03-02
Motivation • Minimalist quantizers can’t achieve high resolution without introducing matching and linearity problems • Need architecture around the quantizer to boost resolution • Trade power, area, or bandwidth • Must maintain minimal complexity (analog and digital) • Possible solutions: cascading, ΔΣmodulation, and oversampling 2012-03-02
Pipelined ADCs [9-11] • Many low-resolution stages; amplifies quantization error • Exchanges power/area for resolution • Maintains throughput Allen Waters 2012-03-02 17
Pipelined ADCs [9-11] • Many low-resolution stages; amplifies quantization error • Exchanges power/area for resolution • Maintains throughput • Requires k opamps • Calibration methods are cumbersome, many error terms Too much analog matching and digital calibration 2012-03-02
Algorithmic ADCs • More minimalist variation of pipelining • Time-share a single stage, performing ksubconversions • Power/area reduced by k • Throughput reduced by k • Requires opamp (but only 2) • Same gain error / variation in each stage simplifies calibration 2012-03-02
Introduction to ΔΣ Modulation • Feedback subtracts output from input • Error is low-pass filtered by H • Differentiating Q suppresses it at small frequencies • Oversampling makes signal band very small relative to sampling frequency • In-band noise strongly attenuated • Can improve resolution by increasing filter order, OSR, or number of quantizer levels [12] 2012-03-02
Minimalist ΔΣ Modulation [13] • With low-performance opamps, restrict to first-order modulators • Add feedforward path such that loop filter only processes error, not input signal • Reduces requirements for loop filter linearity • Process residue with another stage • Multi-stAge noise SHaping (MASH) • Higher order noise shaping without stability concerns Requires digital filter to recombine different stage outputs 2012-03-02
ΔΣ with VCO-Based Quantizer • Compare VCO phase to previous state (1-z-1) • Quantizer output is frequency • Feedback and gain stage predistort tuning voltage to improve linearity • Need full range of tuning voltage to achieve all possible outputs • Still limited by VTC nonlinearity 2012-03-02
ΔΣ with VCO-Based Quantizer • Compare VCO phase to reference phase [1] • Quantizer output is phase • Feedback holds tuning voltage constant • Achieves all possible output states • Unaffected by VTC nonlinearity • Compare VCO phase to previous state (1-z-1) • Quantizer output is frequency • Feedback and gain stage predistort tuning voltage to improve linearity • Need full range of tuning voltage to achieve all possible outputs • Still limited by VTC nonlinearity 2012-03-02
ΔΣ with Integrating Quantizer • (2nd-order loop filter) + (1st-order noise shaping in quantizer) = (3rd-order noise shaping total) • Although ΔΣ typically uses flash, there are benefits to using other quantizers [7] 2012-03-02
Stochastic Conversion • Previous methods focus on immunity to variations in analog components • Example: comparator offset voltage Vos • Using k 1-bit comparators: • For large k, Vosdistributed with Gaussian PDF • Vin sweep gives Gaussian CDF • Corrected with inverse Gaussian DSP function [14] 2012-03-02
Stochastic Conversion • High-speed • Low analog complexity (synthesizable) • High-power (k comparators) • Scales poorly: k = 4N [14] Allen Waters 2012-03-02 26
Summary of Minimalist Techniques • ΔΣModulation (speed for resolution) • Noise-shaping and oversampling improve performance even with low-quality analog components • Stochastic (power/area for resolution) • Uses matching variations to improve accuracy • Algorithmic (speed for resolution) • Will require calibration, just not as bad as pipelined ADC • Pipelining (power/area for resolution) • Performance relies heavily on high-gain opampsand complicated background calibration Decreasing minimalism 2012-03-02
Presentation Outline • Motivation • Minimalist Quantizers • Techniques to Improve Resolution • Automating Analog Design • Proposed Structure • Conclusions 2012-03-02
Analog Cell Synthesis • Tools exist to automate analog cell design (opamps, band-gap reference, etc.) • Select topology • Size and bias devices • Verify performance over operating variations • Results only as accurate as specifications from designer • Will be entirely different with each process • Still perform layout by hand [15] 2012-03-02
Analog Cell Synthesis • Instead, automate system layout • Using minimalist design, system architecture won’t change much between processes • Few analog components to layout in new process • System layout automatically generated from individual cell layouts 2012-03-02
ADC Design Using Digital Tools • For fundamental analog building blocks: • Manually create layout (*.gds) and connectivity information (*.lef) • Include these custom cells in Verilog file • Digital synthesizer ignores them • Place-and-route: places layers in *.gds, routes to pins in *.lef • Want control over routing among analog components • Can use timing information or Verilog macros [14] 2012-03-02
Presentation Outline • Motivation • Minimalist Quantizers • Techniques to Improve Resolution • Automating Analog Design • Proposed Structure • Conclusions 2012-03-02
Equivalent Stochastic ADCs • Sampling k comparators 1 time vs. sampling 1 comparator k times (proposed) • Comparator input noise distributes Vthreshold with Gaussian PDF 2012-03-02
Oversampled Noisy Comparator • Oversamples in time-domain, rather than in “area-domain” like previously discussed stochastic ADC • Highly digital • Low complexity • Low power • Very slow (k = 4N for N-bit resolution) • Very small input range, determined by σ of input-referred comparator noise • Could be appropriate for passive DC sensors • No need to amplify sensor output 2012-03-02
Why Does Resolution Scale So Poorly? k = 4N • DSP uses piece-wise linear correction function • Linear region of CDF => 1x slope • Tail regions with higher slopes skip output codes Slope > 1 causes lost codes in output 2012-03-02
Ideal Input Noise Distribution • If noise could be uniformly distributed, looks like a k-level flash • Now scales as k = 2N • Since CDF is linear, don’t need DSP correction • But uniformly-distributed noise is implausible 2012-03-02
Creating Uniformly Distributed Region • Two comparators, with ±σ offsets [14] • Middle half approaches a linear distribution 2012-03-02
Creating Uniformly Distributed Region always 0 always 1 input range • Constrain input range to more linear region • Half of comparator decisions are worthless, because input-referred noise is greater than input range • 2x samples / clock cycle 2012-03-02
Tradeoffs in Proposed Design • Proposed single-comparator stochastic ADC using input-referred comparator noise to resolve signal • Highly digital (synthesizable) • Low complexity • Low power/area • Extremely slow • Two-comparator implementation • Increases speed exponentially • DSP correction function is more simple • Requires comparator offset to be adjusted extremely accurately, on the same order of magnitude as the comparator noise σ • Possible performance improvements • Create noise source that is nearly linear • Add feedback for noise shaping 2012-03-02
Presentation Outline • Motivation • Minimalist Quantizers • Techniques to Improve Resolution • Automating Analog Design • Proposed Structure • Conclusions 2012-03-02
Conclusions • Analog circuit scaling lags behind digital • Need minimalist ADC structures that are immune to component mismatch and variation • Minimalist quantizers achieve low resolution • Use oversampling, cascading and noise-shaping to boost resolution at expense of speed/power • If resistant to routing variations, analog cells could be included in existing digital design flow • Proposed a new stochastic ADC that oversamples input-referred noise to resolve signal 2012-03-02
References [1] M. Park and M. Perrott, “A 78 dB SNDR 87 mW 20 MHz Bandwidth Continuous-Time ΔΣ ADC With VCO-Based Integrator and Quantizer Implemented in 0.13 μm CMOS,” IEEE J. Solid-State Circuits, vol. 44, no. 12, pp. 3344–3358, Dec. 2009. [2] S. Weaver, B. Hershberg, P.K. Hanumolu, and U. Moon, “A Multiplexer-Based Digital Passive Linear Counter (PLINCO),” in Proc. IEEE Int. Conf. on Electronics, Circuits and Syst., 2009, pp. 607–610. [3] J. Guerber, M. Gande, H. Venkatram, A. Waters, and U. Moon, “A 10b Ternary SAR ADC with Decision Time Quantization Based Redundancy,” in Proc. IEEE Asian Solid-State Circuits Conf., 2011, pp. 65–68. [4] M. Straayer and M. Perrott, “A 12-Bit, 10-MHz Bandwidth, Continuous-Time ΔΣ ADC With a 5-Bit, 950-MS/s VCO-Based Quantizer,” IEEE J. Solid-State Circuits, vol. 43, no. 4, pp. 805–814, Apr. 2008. [5] ——, “A Multi-Path Gated Ring Oscillator TDC With First-Order Noise Shaping,” IEEE J. Solid-State Circuits, vol. 44, no. 4, pp. 1089–1098, Apr. 2009. [6] N. Maghari, G.C. Temes, and U. Moon, “Noise-shaped integrating quantisers in ΔΣ modulators,” IET Electron. Lett., vol. 45, no. 12, pp. 612–613, June 2009. [7] N. Maghari and U. Moon, “A Third-Order DT ΔΣModulator Using Noise-Shaped Bi-Directional Single-Slope Quantizer,” IEEE J. Solid-State Circuits, vol. 46, no. 12, pp. 2882–2891, Dec. 2011. [8] M. Park and M.H. Perrott, “A Single-Slope 80MS/s ADC using Two-Step Time-to-Digital Conversion,” in Proc. IEEE Int. Symp. on Circuits and Syst., 2009, pp. 1125–1128. 2012-03-02
References [9] C.R. Grace, P.J. Hurst, and S.H. Lewis, “A 12-bit 80-MSample/s Pipelined ADC With Bootstrapped Digital Calibration,” IEEE J. Solid-State Circuits, vol. 40, no. 5, pp. 1038–1046, May 2005. [10] I. Galton, “Digital Cancellation of D/A Converter Noise in Pipelined A/D Converters,” IEEE Trans. Circuits Syst. II, vol. 47, no. 3, pp. 185–196, Mar. 2000. [11] H. Liu, Z. Lee, and J.Wu, “A 15-b 40-MS/s CMOS Pipelined Analog-to-Digital Converter With Digital Background Calibration,” IEEE J. Solid-State Circuits, vol. 40, no. 5, pp. 1047–1056, May 2005. [12] B. Boser and B. Wooley, “The Design of Sigma-Delta Modulation Analog-to-Digital Converters,” IEEE J. Solid-State Circuits, vol. 23, no. 6, pp. 1298–1308, Dec. 1988. [13] R. Schreier and G. Temes, Understanding Delta-Sigma Data Converters, 1st ed. Hoboken, NJ: John Wiley and Sons, Inc, 2005. [14] S. Weaver, “Automated Synthesis of Analog to Digital Conversion,” Ph.D. dissertation, Oregon State University, 2010. [15] E.S. Ochotta, T. Mukherjee, R.A. Rutenbar, and L.R. Carley, Practical Synthesis of High-Performance Analog Circuits, 1st ed. Norwell, MA: Kluwer Academic, 1998. 2012-03-02
Barrel Shifting and DEM • Delay cell transitions resume where previous cycle left off • Barrel shift through delay cells shapes the td mismatch • Using phase output from XOR gates, also get dynamic element matching (DEM) of DAC elements to shape mismatch 2012-03-02
Example Cell Design and Usage ADC.v unitC.lef MACRO unitC ORIGIN 0.00 0.00 ; SIZE 14.52 BY 15.12 ; PIN A DIRECTION INOUT ; PORT LAYER metal5 ; RECT 2.91 3.21 11.61 11.91 ; END END A PIN B ... END B PIN VDD ... END VDD PIN VSS ... END VSS OBS ... END END unitC ... module myModule(input X, output Y); supply1 VDD; supply0 VSS; ... unitC C1( .A(X), .B(VSS) ); ... endmodule myModule ... • Placing custom cells is easy • Controlling the routing is the challenge 2012-03-02
Resolution vs. Oversampling • 1 comparator: k = OSR = 4N • 1 comparator, uniform noise distribution: k = OSR = 2N • 2 identical comparators: k = 4N OSR = 4N / 2 • 2 comparators with ±σ offset: k ≈ 2N x 2 OSR ≈ 2N will be somewhat greater than this, depending on how uniform combined PDF is over input range 2012-03-02