1 / 14

Scanning Electron Microscope

Join us at the Scanning Electron Microscope Innovation Center on 16/9/10 to witness cutting-edge analysis conducted by Supervisor Birgir Jóhannsson and students. Discover the fascinating world of electron microscopes, with magnifications up to 2,000,000x and resolutions that reveal minute details. Explore the two common types, Transmission EM and Scanning EM, with a focus on SEM. Delve into elemental analysis using Energy-dispersive X-ray spectroscopy to uncover chemical compositions. Uncover how EM can scan areas and points, making it a powerful tool for surface analysis. Dive into real-world applications, from pollution monitoring near Fjarðarál to studying composition changes in coins. For more insights, visit the provided references.

lust
Download Presentation

Scanning Electron Microscope

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. Scanning Electron Microscope Innovation Center, Analysis performed 16/9/10 Supervisor: Birgir Jóhannsson Students:, Frímann, Hafdís, Helgi, Ísak, Þorvaldur

  2. Electron microscope in general • Light microscopes can get 2000x magnification • Electron microscopes (EM) can get up to 2.000.000x magnification • The resolution is determined by focusing of the electron beam • Two most common types, Transmission EM and Scanning EM • SEM at the Innovation Center

  3. The electron beam • The electrons are generated from a small ceramic tip, radius of the tip about 0.5μm • The acceleration voltage was 20 kV • The electrons are focused to a spot 0.5-5nm in diameter

  4. Elemental analysis • Energy-dispersive X-ray spectroscopy • Electron from an inner shell is excited and ejected from the atom • Outer shell electron falls to the gap left by the ejected electron and emits an X-ray • Wavelength of the X-ray is characteristic for the atom

  5. Conclusions • Electron microscopes and get an enormous magnification and determine chemical compositions of surfaces with X-ray analysis. • EM can also scan over an area and between points. • The area around Fjarðarál is polluted. • Coins from the early 1980’s differ in composition as opposed to present day.

  6. References • http://en.wikipedia.org/wiki/Scanning_electron_microscope • http://www.purdue.edu/rem/rs/sem.htm

More Related