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Report on the KEK Laser system and Test Bench @ Tsukuba

Report on the KEK Laser system and Test Bench @ Tsukuba. April-27 2006 ILC-CAL meeting S. Uozumi, T. Maeda. Laser Test Bench System @ KEK. YAG Laser l = 532 m m (green) Spot size ~ 1 m m Pulse width ~ 2 nsec Useful for Spot measurement, but not for timing resolution.

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Report on the KEK Laser system and Test Bench @ Tsukuba

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  1. Report on the KEK Laser systemand Test Bench @ Tsukuba April-27 2006 ILC-CAL meeting S. Uozumi, T. Maeda

  2. Laser Test Bench System @ KEK • YAG Laser • l = 532 mm (green) • Spot size ~ 1mm • Pulse width ~ 2 nsec • Useful for Spot measurement, but not for timing resolution • 3/13~3/25 : System setup by 中平、吉村、田口、馬塚、魚住 problem on trigger signal • ~4/20 : Photo diode installed for the trigger signal, start measurement. • ~5/20 : Used by T2K group (田口くん) 100/400pixels(HPK), 600pixels(Russia) • 6/1 ~ : We will start the laser measurement.

  3. KEK Laser – First Result (by 田口君) • Results of the 100 pixel MPPC. • Measure efficiency / gain inside a pixel, with 10 mm pitch. 100μm Laserspot Efficiency (>0.5 p.e. / All) Gain : (only inside sensitive area)

  4. ～30μm KEK – SiPM samples • 20 Russian SiPMs (600 pixels) are available at KEK. • Test-bench system with thermostatic chamber / LED is also available

  5. 20 SiPM characteristics Gain ~ 4 x 105 Device-by-device variation seems not small.

  6. Test-Bench @ Tsukuba • Just launched in last week • LED / thermostatic chamber / CAMAC / VME • Latest 400 / 1600 pixel MPPC samples from Kobe

  7. ゲインのバイアス電圧依存性(室温での測定) d AMP 素電荷 ２つの４００pixel MPPC ピクセル容量 ガイガーモード開始電圧 C = 0.13 ± 0.01 pF V0= -67.6 ± 0.01 V

  8. Noise rate • 400 pixel MPPC • Threshold ~ 0.5 p.e.

  9. Plans at Tsukuba Short / Mid term … targets to the beam test in 2006/2007 • Evaluate fundamental performances of the latest MPPC samples • Gain, noise rate, Linearity, P.D.E., cross-talk, dead-time • Its temperature dependence • Bench test using laser system @ KEK • P.D.E./ Gain uniformity (Pixel-by-pixel / within a pixel) • Cross-talk • Its bias voltage dependence • Practical test with strip scintillator / WLSF • Then provide feedbacks to HPK, and test newer samples Long term … • Long-term stability • Timing resolution • Absolute P.D.E., wave length dependence • Magnetic field test • Evaluate device-by-device characteristics 今年度の筑波大ILCメンバー : 金, 魚住, 前田(M2), 4年生1人

  10. Backups

  11. SiPM - ADC分布 1710-043 Vbias=-49.4V Pedestal Signal • ノイズレート～1MHz時のADC分布 • Single p.e.のS/N～2.0 • HPK製のものを同様に測るとS/N～4.3 • Pedestalのσ～8.9 • エレキのノイズ等まだ多い？

  12. SiPM - 波形 1710-043Vbias=-49.4V Noise Signal • 信号のタイミングがばらついている

  13. SiPM - ノイズレート • Threshold：-17mV • ゲインと同様、逆バイアス電圧にほぼ比例 • 0509series～800kHz/Vbias 1710series～370kHz/Vbias

  14. SiPM - カレント • ゲイン、ノイズレート同様、逆バイアス電圧にほぼ比例 • 0509series～0.27μA/Vbias 1710series～0.14μA/Vbias • ゲイン・ノイズレート・カレントにおいて、0509seriesの方が1710seriesよりも逆バイアス電圧にsensitive

  15. HPK製MPPC • Sample 311-53-1A-002-3 • Vbias=-69.0V noise～1MHz • SiPMと同じ回路で測定 • S/N～4.3c.f.　ロシア製　～2.0 • ゲイン～6.4×105c.f.　ロシア製　～4.4×105

  16. 400pix MPPC - LEDに対する信号 １５０nSec

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