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IEEE Std 1581 is published … Now what?

IEEE Std 1581 is published … Now what?. 2011 Board Test Workshop Heiko Ehrenberg. Key elements in IEEE Std 1581. Simple test logic implementation for complex, slave-type devices No extra pins required No reliance on complex access cycles Fast test execution, small test vector set

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IEEE Std 1581 is published … Now what?

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  1. IEEE Std 1581 is published …Now what? 2011 Board Test Workshop Heiko Ehrenberg

  2. Key elements in IEEE Std 1581 Simple test logic implementation for complex, slave-type devices No extra pins required No reliance on complex access cycles Fast test execution, small test vector set Usable with any access methodology (Boundary scan, functional, ICT)

  3. Basic concept PCB IEEE 1581 device Optional Test Pin (if no TTM) Memory Controller Test Control TTM (optional) IEEE 1149.1 device(s) Memory Cells Input Bus x CombinationalTest Logic y Output Bus

  4. Test entry or exit is triggered by a condition on the pins that would otherwise never exist under normal functional conditions These methods may require additional board-level and/or controlling device DFT to be implemented Test mode control • One of seven transparent test mode (TTM) control methods: • Non-functional stimulus (NFS) • Designated command codes (DCC) • Simultaneous input/output (SIO) • Clock frequency (CKF) • Analog level (ANL) • Conditional power-up initiation (CPI) • Default power-up initiation (DPI) • or aDedicated test pin (TPN)

  5. Test logic • One of three defined test logic architectures: • XOR (3-input XOR or XNOR gates) • IAX (XOR, Inverters, and AND gates) • XOR-2 (2-input XOR or XNOR gates) • Or a custom test logic that satisfies rules in IEEE Std 1581-2011

  6. Optional test functions • Optional test functions accessible via Test Pattern Partitioning (TPP) • Examples include: • Reading a device identification (ID) • Control line continuity test • Built-in self test (BIST) access • Other public or private commands

  7. Outlook for IEEE Std 1581 • IEEE Std 1581 approved March 2011 and published in June 2011 • Working group is considering future work: • Description language • Bi-directional test features • …

  8. Thank you Heiko Ehrenberg (h.ehrenberg@ieee.org) For more details and questions, or to join the working group, contact me:

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