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Device Fabrication Example. Group:- 2. pn junction Diode Fabrication. Start:- The starting point is a flat, damage-free , single-crystal, Si wafer. Common dopants are boron for P-type layers and phosphorus, antimony and Arsenic for N-type layers.
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Device Fabrication Example Group:- 2
pn junction Diode Fabrication Start:- • The starting point is a flat, damage-free , single-crystal, Si wafer. • Common dopants are boron for P-type layers and phosphorus, antimony and Arsenic for N-type layers. • Assume the wafer is p-type, having been uniformly doped with boron during the formation of the crystal.
1.Oxidation:- • The process of oxidation consists of growing a thin film of silicon dioxide on the surface of the silicon wafer. • It will serve as a diffusion barrier. The oxide thickness must be comfortably greater than the projected masking thickness.
2.Lithography#1:- • This process performed to open “diffusion” holes in the oxide that will eventually become the positions of the pn junction diodes.
3.Phosphorus Diffusion • After a proper clean-up the wafer is nest inserted into a phosphorus pre-deposition Furnace. • The formation of n+ -p junctions is surface regions not protected by the oxide. (The + in n+ is indicate a very high doping.
4.Metallization(sputter Al) • Evaporation of Al yields a thin metal film over the entire surface of the wafer due to connect the device to the ‘’outside world’’
5.Lithography #2:- • It is performed to remove excess metal external to the area of the diffused junction.
To produce commercial diodes, a diamond-edged saw would be used to cut the wafer into pieces containing a single device.
n-well process Fabrication Steps • Typically use p-type substrate for nMOStransistors • Requires n-well for body of pMOS transistors
Oxidation • Blank wafer covered with a layer of SiO2 using oxidation
Photoresist • Spin on photoresist • Photoresist is a light-sensitive organic polymer • Softens where exposed to light
Lithography • Expose photoresist through n-well mask
Etch • Etch the uncovered oxide using HF (Hydroflouricacid)
Strip Photoresist • Etch the remaining photoresist using a mixture of acids
n-well • n-well is formed using either diffusion or ion implantation
Strip Oxide • Strip off remaining oxide using HF. Subsequent steps use the same photolithography process
Polysilicon • Deposit thin layer of oxide. • Chemical Vapor Deposition (CVD) of silicon layer • Forms many small crystals called polysilicon • Heavily doped to be good conductor
PolysiliconPatterning • Use same lithography process to pattern polysilicon
Self-Aligned Process • Cover with oxide to define n diffusion regions
N-diffusion • Pattern oxide using n+ active mask to define n diffusion regions
N-diffusion cont. • Diffusion or ion implantation used to create n diffusion regions
N-diffusion cont. • Strip off the oxide to complete patterning step
P-Diffusion • Similar set of steps form p+ diffusion regions for pMOS source and drain and substrate contact
Contacts • Cover chip with thick field oxide • Etch oxide where contact cuts are needed
Metallization • Sputter on aluminum over whole wafer • Remove excess metal leaving wires
Detailed Mask Views • Six masks • n-well • Polysilicon • n+ diffusion • p+ diffusion • Contact • Metal Fabrication and Layout