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Repair Program For SGH-E700

Repair Program For SGH-E700. Samsung Electronics GSM S/W Lab Sang-Hoon Kim. Contents. Basis of Repair Program Program Main Base Band Memory Test Battery Audio Radio PCF 50601 GPIO / GPON. Basis of Repair Program. For Hardware Test Same Interface with Calibration

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Repair Program For SGH-E700

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  1. Repair Program For SGH-E700 Samsung Electronics GSM S/W Lab Sang-Hoon Kim

  2. Contents • Basis of Repair Program • Program Main • Base Band • Memory Test • Battery • Audio • Radio • PCF 50601 • GPIO / GPON GSM S/W Lab, R&D Group #2, Samsung Electronics

  3. Basis of Repair Program • For Hardware Test • Same Interface with Calibration • BB, RF, Audio, Registers, Miscellaneous.. • Equipments • Radio Test Equipments • Power Supply • JIG Set • RF Cable • PC GSM S/W Lab, R&D Group #2, Samsung Electronics

  4. Program Main • Menus Com Port Monitor GSM S/W Lab, R&D Group #2, Samsung Electronics

  5. Base Band Test • LCD Test • LCD Backlight • Key Test • Keyboard Backlight • RTC Time Test • RTC Time R/W • IMEI Test • IMEI Number R/W Read RTC Time of MS Modify MS time as Current Pc time Modify MS time as input box’s GSM S/W Lab, R&D Group #2, Samsung Electronics

  6. Memory Test • RAM Test • Show Result only • Ram Test takes place only During Initialization • Flash Test • Flash Test • to Check the flash • Flash Checksum • to calculate the checksum of the embedded SW Stored in the Flash GSM S/W Lab, R&D Group #2, Samsung Electronics

  7. Battery Test • ADC Read • Read Voltage • Read Temperature • Can Cyclic Read • Battery Section • View Battery EEPROM Section Data • File I/O • EEPROM I/O GSM S/W Lab, R&D Group #2, Samsung Electronics

  8. Audio Test #1 • Audio Test Panel • Audio Loop Test • Frequency Generation GSM S/W Lab, R&D Group #2, Samsung Electronics

  9. Audio Test #2 • Audio Section • View Audio EEPROM Data • File I/O GSM S/W Lab, R&D Group #2, Samsung Electronics

  10. Radio Test #1 • Synthesizer On/Off • Select Band • Channel Input • AGC Setting • Start & Stop GSM S/W Lab, R&D Group #2, Samsung Electronics

  11. Radio Test #2 • Rx Test • Rx Parameter • Rx Power Measurement • Single Burst • Continuous Burst • File I/O GSM S/W Lab, R&D Group #2, Samsung Electronics

  12. Radio Test #3 • Tx Test • Tx Burst Generation • Update Channel • Update Level • Modify Tx Parameters • File I/O GSM S/W Lab, R&D Group #2, Samsung Electronics

  13. PCF 5060 • PMU Control • Register Setting • Read Interrupt Source • Regulator Setting GSM S/W Lab, R&D Group #2, Samsung Electronics

  14. GPIO/GPON Test • GPIO Values • Set GPIO 0~9 • Set GPON 0~2 • Read Write All GSM S/W Lab, R&D Group #2, Samsung Electronics

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